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Surface multi-point focusing system and surface multi-point focusing method

A focusing method and multi-point technology, applied in the field of measurement, can solve problems such as low measurement efficiency and increased error

Inactive Publication Date: 2012-10-31
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the process of measuring the workpiece by the vision measuring instrument using the vision measuring system (Vision Measuring System, VMS), it is necessary to measure and evaluate the height of every minute point on the surface of the workpiece. However, the measurement of the fine points often requires the use of auxiliary equipment In order to meet customer requirements
In this way, it will inevitably lead to low measurement efficiency and increased error

Method used

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  • Surface multi-point focusing system and surface multi-point focusing method
  • Surface multi-point focusing system and surface multi-point focusing method
  • Surface multi-point focusing system and surface multi-point focusing method

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Embodiment Construction

[0030] like figure 1 Shown is a functional block diagram of a preferred embodiment of the surface multi-point focusing system of the present invention. The surface multi-point focusing system 2 is applied to the image measuring instrument 1 to perform multi-point focusing on the surface of the workpiece and take points, so as to obtain the point cloud of the surface contour of the workpiece to accurately measure all aspects of the workpiece. In addition, in other embodiments, the surface multi-point focusing system 2 can also be applied in electronic devices connected to the image measuring instrument 1 , such as computers, servers, measuring instruments, and the like.

[0031] The image measuring instrument 1 includes a processor 10 and a storage device 12 . The processor 10 is used to execute various software installed in the image measuring instrument 1 , for example, application software such as the surface multi-point focusing system 2 and an operating system. The stora...

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Abstract

The invention discloses a surface multi-point focusing system used for an image measuring instrument, wherein the image measuring instrument comprises a CCD (Charge Coupled Device) located at the axis Z. The system comprises a selection module, a calculation module and an output module. The selection module is used for determining a focusing point selection mode; the calculation module is used for calculating a first position coordinate of each focusing point in each image of a work piece obtained by the CCD when the CCD moves in a predetermined focusing range, and determining an adjusted focusing range; the calculation module is further used for calculating a second position coordinate of each focusing point in each image of the work piece obtained by the CCD when the CCD moves in the adjusted focusing range; and the output module is used for outputting the second position coordinate of the focusing point in the adjusted focusing range. The invention further provides a surface multi-point focusing method. By the system and the method provided by the invention, multi-point focusing can be executed on the surface of the work piece so as to obtain measurement data.

Description

technical field [0001] The invention relates to a measurement technology, in particular to a system and method for performing multi-point focusing on the surface of a workpiece to realize measurement. Background technique [0002] The image measuring instrument is a kind of coordinate measuring machine, which can use an optical microscope to magnify and image the object to be measured at a free magnification, and transmit the enlarged image of the object to be measured to the computer connected to the instrument through the CCD camera system for Non-contact and efficient detection of geometric quantities of various complex workpieces. [0003] In the process of measuring the workpiece by the vision measuring instrument using the vision measuring system (Vision Measuring System, VMS), it is necessary to measure and evaluate the height of every minute point on the surface of the workpiece. However, the measurement of the fine points often requires the use of auxiliary equipmen...

Claims

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Application Information

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IPC IPC(8): G02B7/34G01C11/02G01B11/03G02B7/28
CPCG02B7/38G01B11/03G01C11/02
Inventor 张旨光陈贤艺袁忠奎薛晓光
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD