Method for measuring solid-solid thermal contact resistance via up-and-down constant temperature parameter identification method
A parameter identification method and a technology of contact thermal resistance, applied in the field of testing, can solve the problems of temperature measurement uncertainty error, difficult interface contact thermal resistance measurement accuracy, etc., and achieve the effect of eliminating heat loss and fast contact thermal resistance
Active Publication Date: 2012-11-14
NANJING UNIV OF SCI & TECH
View PDF6 Cites 11 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Most of the steady-state contact thermal resistance test methods are similar to the test standard equipment of the American National Standard ASTMD5470-06, but many documents point out that due to the uncertainty error of temperature measurement and heat loss error, it is difficult to ensure sufficient contact thermal resistance at the interface. high measurement accuracy
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0026] Therefore, in order to solve the above problems, the present invention proposes a method for measuring solid-solid contact thermal resistance by constant temperature correction up and down on the basis of the American National Standard ASTM D5470. Constant temperature parameter identification eliminates the error term and heat loss error of each temperature sensor, combined with the controllable temperature radiation shield and auxiliary measures to reduce the loss of lateral heat flow, to achieve the purpose of high-precision testing of the thermal physical parameters of the specimen. The method can measure the interface contact thermal resistance between the same material and different materials with high precision.
[0027] exist figure 1 Among them, the present invention discloses a testing device for high-precision thermal interface materials. The device is a symmetrical structure for testing up-and-down positive and negative bidirectional heat flow, including a co...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a method for correcting and measuring a solid-solid thermal contact resistance via up-and-down constant temperature based on an American national standard ASTMD 5470. A high precision temperature sensor is adopted to perform up-and-down constant temperature parameter identification for a test-ware via a multi-point constant temperature so as to eliminate the error terms and the hot loss errors of the temperature sensors, and is combined with a controllable warm radiation radiation-proof screen and the auxiliary measures, so that an aim of high-precisely testing the thermophysical parameters of the test-ware is achieved. According to the method, the interface thermal contact resistances between same materials and different materials can be measured with high precise.
Description
technical field [0001] The invention belongs to the technical field of testing, in particular to a method for testing solid-solid contact thermal resistance, in particular to an upper and lower constant temperature parameter identification method for measuring solid-solid contact thermal resistance. Background technique [0002] Contact thermal resistance is a parameter affected by many factors such as material properties, mechanical properties, surface morphology, contact pressure, temperature, and gap material. According to whether the experimental heat flow is stable, the contact thermal resistance measurement methods are generally divided into transient method and steady state method. Transient method is also a commonly used experimental measurement method of thermal contact resistance, which mainly includes laser photothermal measurement method, thermal imaging method, "flash" flash method, laser photoacoustic method, etc., and laser photothermal measurement method also...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20
Inventor 宣益民张平李强徐德好
Owner NANJING UNIV OF SCI & TECH