Microgravity testing device based on quartz flexible accelerometer

A technology of accelerometer and testing device, which is applied in the direction of measuring device, gravitational field measurement, geophysical measurement, etc. It can solve the problems of small range of microgravity measuring device, lower accuracy of accelerometer, and low data reliability, so as to achieve real-time processing , mechanical noise reduction, damping reduction effect

Active Publication Date: 2012-11-14
航天科工惯性技术有限公司
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  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

[0004] The existing microgravity measurement device has a small range and a narrow passband. Due to the mixed microgravity data of the spacecraft, the device is prone to data loss due to frame loss, empty frames, reframes, and error codes during data transmission, and the data is reliable. Sex is not high
At the same time, because the accelerometer is not designed to be sealed, when the device operates in space for a long time, the accuracy of the accelerometer will decrease with the change of gas pressure. At the same time, the ambient temperature of the device will change drastically during the orbital operation stage, and the accuracy of the accelerometer will drop significantly when the temperature changes.

Method used

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  • Microgravity testing device based on quartz flexible accelerometer
  • Microgravity testing device based on quartz flexible accelerometer
  • Microgravity testing device based on quartz flexible accelerometer

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Embodiment Construction

[0032] The present invention will be further introduced below in conjunction with the accompanying drawings.

[0033] The invention uses a high-resistance sampling amplifying circuit to realize signal sampling, amplification and amplitude limiting through differential sampling, and through low-pass filtering of a second-order voltage-controlled voltage source to ensure that the frequency of the microgravity acceleration signal is within the passband range. The limited analog voltage is converted by the A / D conversion circuit, and the FPGA controller collects the digital voltage signal of the A / D conversion circuit and converts it into a 422 level output through the communication interface circuit. Perform timing control on the A / D conversion circuit.

[0034] Such as figure 1 As shown, the present invention includes a quartz flexible accelerometer assembly, a sampling circuit, a filter circuit, a gate circuit, an A / D conversion circuit, a communication interface circuit and a...

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Abstract

The invention discloses a microgravity testing device based on a quartz flexible accelerometer. The microgravity testing device comprises a quartz flexible accelerometer assembly, a sampling circuit, a filter circuit, a gating circuit, an analog / digital (A / D) conversion circuit, a communication interface circuit and a field programmable gate array (FPGA) controller. The quartz flexible accelerometer assembly comprises the quartz flexible accelerometer and a temperature control system which comprises a temperature control circuit, a heating element, a heat preservation cover, an installation base body and a base. The microgravity testing device based on the quartz flexible accelerometer has the advantages of being low in noise, large in range, wide in transmission band, and capable of avoiding data loss caused by frame dropping, frame emptying, frame repetition, error codes and the like, and improving reliability of data.

Description

technical field [0001] The invention relates to a microgravity test device, in particular to a microgravity test device based on a quartz flexible accelerometer, which belongs to the technical field of space microgravity measurement. Background technique [0002] The microgravity acceleration on space vehicles includes quasi-steady-state acceleration, transient acceleration and vibration acceleration. 1) Quasi-steady-state acceleration: the change frequency is not more than 0.01Hz, generally not more than 10 -6 g. The main causes of quasi-steady-state acceleration are atmospheric resistance, tidal force, solar radiation pressure, etc.; 2) Transient acceleration: the value of transient acceleration is generally within 10 -4 g. The main causes of transient acceleration include spacecraft orbit change thrust, orbit control and attitude control thrust, spacecraft auxiliary equipment and payload actions, astronaut activities, etc.; 3) Vibration acceleration: the value of vibrati...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01V7/16
Inventor 魏超郭琳瑞邱宏波刘英张秋月梁杰许中生
Owner 航天科工惯性技术有限公司
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