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Equipment for measuring parameters of optical device

A technology of optical devices and equipment, which is applied in the field of optical device parameter measurement, can solve the problems of complex structure, high price and inconvenient operation of equipment, and achieve the effect of low operating cost, easy operation and simple structure

Inactive Publication Date: 2012-11-28
GUANGDONG VTRON TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In the process of realizing the embodiment of the present invention, the inventor found that although many existing equipment for measuring optical device parameters can accurately measure, they are expensive and have a complicated equipment structure. In addition, for optical devices (such as LED emission tubes) When measuring different parameters of different parameters, it is necessary to use different measuring equipment to measure separately, which is not easy to operate

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  • Equipment for measuring parameters of optical device
  • Equipment for measuring parameters of optical device
  • Equipment for measuring parameters of optical device

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Embodiment Construction

[0029] The embodiment of the present invention provides a device for measuring the parameters of the optical device, which has a simple structure design and is used for quickly inspecting and measuring the parameters of the optical device.

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0031] The details are as follows:

[0032] Please refer to figure 1 , figure 1 A schematic structural diagram of a device for measuring optical device parameters provided by an embodiment of the present invention, wherein th...

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Abstract

The embodiment of the invention discloses equipment for measuring parameters of an optical device. The equipment is used for quickly measuring the parameters of the optical device. The equipment comprises an LED (Light Emitting Diode) transmitting tube arranged at the center of a rotating device, an LED driving module, a master control module, a linear array camera acquisition module and a data processing module, wherein the main control module is used for controlling the rotating device to rotate the linear array camera acquisition module to the right front part of the LED transmitting tube; the linear array camera acquisition module is used for detecting light transmitted by the LED transmitting tube and acquiring image data; the LED driving module is used for carrying out constant-current driving on the LED transmitting tube when the linear array camera acquisition module detects; the master control module is also used for receiving the image data acquired by the linear array camera acquisition module; the image data are transmitted to the data processing module through the data transmitting module; and the data processing module is used for receiving the image data transmitted by the data transmission module and calculating and obtaining the light intensity, a light transmission angle and a light distribution curve of the LED transmitting tube.

Description

technical field [0001] The invention relates to the technology in the field of optical device parameter measurement, in particular to a device for measuring optical device parameters. Background technique [0002] At present, many devices in work and life use optical devices such as light-emitting diodes (LEDs, Light Emitting Diodes) and optical filters, but in practical applications, some optical devices may cause the optical parameters of the optical device to change due to quality problems. Does not meet usage requirements. When the number of optical components is large, especially in the process of mass production, if the components with quality problems cannot be found as early as possible, it may cause great losses. Therefore, it is necessary to use some measuring equipment to be able to inspect and measure various parameters of optical devices. [0003] In the process of realizing the embodiment of the present invention, the inventor found that although many existin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G01J1/00G01B11/26
Inventor 任均宇刘小青陈伟钦
Owner GUANGDONG VTRON TECH CO LTD