Test processing device and test processing method
A processing device and processing method technology, applied in the field of test processing device and test processing, can solve problems such as limited application scope, low test coverage, and inability to support testing, so as to avoid differences in test results, improve test efficiency, and improve Development quality effects
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[0036] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0037] In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here, therefore, the present invention is not limited to the specific embodiments disclosed below limit.
[0038] figure 2 A flow chart of a test processing method according to an embodiment of the present invention is shown.
[0039] Such as figure 2 As shown, the present invention also provides a test processing method, comprising: step 202, obtaining the test case in the system; step 204, setting the context parameters required by the test target component to the thread context of the test case; step ...
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