Device and method for simulating electronic component failure in aerospace environment
A technology for electronic devices and aerospace, which is applied in the field of devices for simulating the failure of electronic devices in aerospace environments, can solve the problems of complex preparation methods, single-targeting of one or several simulated environments, and inability to prepare.
Active Publication Date: 2015-07-08
TSINGHUA UNIV
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Problems solved by technology
The current simulated environment preparation methods for aerospace devices are relatively single for one or several simulated environments, and cannot be objectively and comprehensively prepared for the main environmental factors in the space environment in which they work.
And most of its preparation methods are too complicated to systematically study the preparation of aerospace devices.
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[0025] The present invention provides a device and method for simulating the failure of electronic devices in the aerospace environment. The present invention will be further described below in conjunction with the accompanying drawings and specific implementation methods:
[0026] The simulated environment of the device includes indoor atmosphere or ultraviolet radiation environment, atmospheric environment, temperature field environment and direct current electric field environment in low vacuum environment.
[0027] Its structure is as figure 1 As shown, the vacuum chamber 1 has three flange interfaces: a sample stage flange interface 6, an atmosphere flange interface 9, and an ultraviolet flange interface 10, and is provided with a vacuum pre-extraction channel 16; the sample stage 5 is located in the vacuum chamber 1 , connected to the external heating transformer 7 and temperature controller 8 through the sample stage flange interface 6; the ultraviolet lamp 2 is arrange...
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The invention discloses a device and a method for simulating electronic component failure in an aerospace environment in the technical field of preparation of aerospace electronic components. A vacuum cavity of the device is provided with a sample stage flange interface, an atmosphere flange interface, an ultraviolet flange interface and a pre-vacuumizing channel; a sample stage is positioned in the vacuum cavity and is connected with an external heating transformer and a temperature controller; an ultraviolet lamp is arranged above the sample stage and is connected with an external ultraviolet controller; and the sample stage is provided with a ceramic sample fixing pillar and a metal sample fixing pillar, wherein the metal sample fixing pillar is connected with an anode of an external direct current electric field controller through a connector and a ceramic shell guide line, and a cathode of the direct current electric field controller is connected with a shell of the vacuum cavity through a fixed resistor. The device and the method can be used for comprehensively and easily simulating the working environments of an aerospace component, including an indoor atmosphere or low vacuum environment of an ultraviolet irradiation environment, an atmosphere environment, a temperature field temperature and a direct-current electric field environment.
Description
technical field [0001] The invention relates to the technical field of preparation of aerospace electronic components, in particular to a device and method for simulating failure of electronic components in the aerospace environment. Background technique [0002] The reliability of aerospace components is an important guarantee to ensure the safe launch of the aircraft and its long-term operation in the space environment. However, due to the influence of the indoor atmospheric environment on the ground before lift-off assembly, and the long-term influence of factors such as ultraviolet radiation, atmosphere, temperature field and working DC electric field in the space environment after lift-off, the seal damage of some devices will be caused. , Pin breakage, inner lead bonding point disengagement or "long hair" and other failures seriously affect the quality and practical performance of the device and even the whole machine. Therefore, studying the corrosion failure of aero...
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IPC IPC(8): G01R31/00G01N17/00
Inventor 姚文清严楷朱永法
Owner TSINGHUA UNIV