A memory testing device

Abstract

The invention is suitable for the technical field of a computer and provides a test device for an internal memory. The test device comprises a test main board, a central processing unit, a chip set and an internal memory slot, wherein the central processing unit and the chip set are arranged on a TOP surface of the test main board; the internal memory slot is arranged on a BOT surface of the test main board; the internal memory slot comprises at least one internal memory slot of a desktop computer and at least one internal memory slot of a notebook computer; and the internal memory slot of the desktop computer and the internal memory slot of the notebook computer have a same external power supply. Thus, the test device for the internal memory can be used for simultaneously testing the internal memory of the desktop computer and the internal memory of the notebook computer, the piece-bumping risk is avoided, the operation is convenient, the production efficiency is increased and the production cost is lowered.

Description

technical field [0001] The invention relates to the field of computers, in particular to a memory testing device. Background technique [0002] In the existing memory manufacturing process, the test platform used by manufacturers to test the quality of memory products is generally a desktop computer motherboard or a notebook computer motherboard, which usually has the following disadvantages: [0003] This type of testing equipment is not industrialized equipment, its service life is short, and the cost of producing the testing equipment is huge; It is inconvenient to perform plugging and unplugging operations and there is a risk of collision; the memory of the desktop computer and the memory of the notebook computer cannot be tested at the same time, and the production efficiency is low; the memory VDD (memory working voltage) and VREF voltage (memory reference voltage) of the motherboard cannot be specified. It is impossible to set a specific voltage pattern for testing m...

AI Technical Summary

Problems solved by technology

[0003] This type of testing equipment is not industrialized equipment, its service life is short, and the cost of producing the testing equipment is huge; the memory socket of the motherboard and the CPU (Central Processing Unit, central processing unit) and Chipset (chipset) are all on the same side. It is inconvenient to perform plugging and unplugging operations and there is a risk of collision; the desktop computer memory and the notebook computer memory cannot be tested at the same time, and the production efficiency is low; the memory VDD (memory working voltage) and VREF voltage (memory reference voltage) of the motherboard cannot be specified. It is impossible to set a specific voltage pattern for the memory with different characteristics to test, and the quality of the product after the test cannot reach the expected effect

[0004] In summary, the existing memory testing device obviously has inconvenience and defects in actual use, so it is necessary to improve it

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