Spectroscopic device for improving light evenness

A spectroscopic device, a technology of light uniformity, applied in optics, optical components, instruments, etc., can solve the problems of uneven light, uneven monochromatic light irradiation, and inability to evenly illuminate the light, and achieve uniform lighting and improve light intensity. Effect

Inactive Publication Date: 2013-01-16
ENLI TECH
View PDF8 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Since the spectroscopic device 1 is not provided with an optical element for uniformizing the light, the monochromatic light generated by the spectroscope 12 is not uniform on the irradiation plane 10, as figure 2 As shown, the light intensity at the center of the irradiation plane 10 is the

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spectroscopic device for improving light evenness
  • Spectroscopic device for improving light evenness
  • Spectroscopic device for improving light evenness

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. First of all, it should be noted that the present invention is not limited to the following specific embodiments. Those skilled in the art should understand the present invention from the spirit embodied in the following embodiments, and each technical term can be optimized based on the spirit of the present invention. broad understanding. The same or similar components in the figures are denoted by the same reference numerals.

[0024] refer to image 3 , 4 , the spectroscopic device that can improve the uniformity of light in the first preferred embodiment of the present invention can be applied in a spectrum measuring device as the front-stage spectroscopic configuration of the measuring device, and the spectroscopic device includes...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Lengthaaaaaaaaaa
Heightaaaaaaaaaa
Wavelengthaaaaaaaaaa
Login to view more

Abstract

Provided is a Spectroscopic device being able to improve evenness, including: a light source unit, a beam splitter, a set of first light, a light, and a set of the second lens. The spectrometer is used to make the light source the light unit by monochromatic light is produced. The light piece includes a hollow columnar ontology, a lie in the inside of the body surface reflective film, a set of towards the first lens into the smooth surface, a reverse of the smooth surface of the smooth surface, and a surrounding the light source unit of an axis and reflects the light multiple reflector, the reflective surface is defined for a light through a channel. With the light a light homogenization effect, can make in a samples on the irradiation plane under uniform illumination, improve spectrum measurement and the accuracy of analysis.

Description

technical field [0001] The invention relates to a spectroscopic device, in particular to a spectroscopic device which is applied to spectrum measuring equipment and can improve light uniformity. Background technique [0002] refer to figure 1 , is a known spectroscopic device 1 , mainly comprising: a light source 11 and a spectroscope 12 . The light emitted by the light source 1 can be introduced into the beam splitter 12 by optical elements such as reflectors and collector mirrors not shown in the figure. Monochromatic light can be irradiated to an illumination plane 10 directly or after passing through other optical elements. The illumination plane 10 can be placed on a sample to be measured, and the sample is connected to a measuring device, and different spectral measurements can be performed according to different measurement methods, such as absorption spectrum, reflection spectrum, transmission spectrum, etc., thereby It is used to analyze the chemical composition,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G02B27/09G02B27/10
Inventor 廖华贤何振扬
Owner ENLI TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products