Solid-state imaging device, method of driving same, and electronic device using same

Abstract

Disclosed herein is a solid-state imaging device including: a photoelectric conversion section generating signal charges corresponding to the amount of light; a pixel array block having pixels each including three or more charge accumulation sections having a first charge accumulation section section, a second charge accumulation section, and a third charge accumulation section, a plurality of pixel transistors; a scanning block, performing scanning in such a manner that the accumulation period for signal charges becomes simultaneous for all pixels, and scanning low-illuminance signals and readout of a high-illuminance signal; and an arithmetic operation processing section that, prior to readout of a low-illuminance signal, acquires a false signal accumulated in the third charge accumulation section, and corrects the low-illuminance signal and the high-illuminance signal by using the false signal Signal.

Description

technical field [0001] The present disclosure relates to a solid-state imaging device, and more particularly, to a CMOS (Complementary Metal Oxide Semiconductor) type solid-state imaging device, a method of driving the solid-state imaging device, and an electronic device using the solid-state imaging device. Background technique [0002] A general CMOS type solid-state imaging device has a mechanism for continuously scanning a two-dimensionally arranged pixel array for each pixel row, thereby reading out pixel signals from the pixel array. A time delay is generated in the accumulation period for each pixel row by row-sequential scanning, thereby causing a phenomenon called focal plane distortion in which an image captured at the stage of capturing an image of a moving subject is deformed. [0003] When capturing an image of a subject moving at a high speed, for which such image deformation cannot be tolerated, and in a sensing usage application requiring simultaneous capture...

AI Technical Summary

Problems solved by technology

For this reason, until the stage when the signal charge is read out, the signal charge held in the charge accumulation part such as the floating diffusion passes through noise due to the leakage of the charge in the floating diffusion itself and photoelectric conversion (these noises are called spurious signals) deteriorating

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