Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system

A test system and quartz crystal oscillator technology, applied in the field of measurement, can solve the problems of low measurement efficiency and time-consuming, and achieve the effect of improving measurement efficiency and shortening the measurement cycle

Active Publication Date: 2013-02-06
NO 20 RES INST OF CHINA ELECTRONICS TECH GRP
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  • Application Information

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Problems solved by technology

It is time-consuming and may idle the available measurement channels, and the measurement efficiency is extremely low

Method used

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  • Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system
  • Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system
  • Method for simultaneously measuring measured pieces in different types in quartz crystal oscillator testing system

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Embodiment Construction

[0023] refer to figure 1 , the present invention simultaneously measures the method for different types of test pieces in a quartz crystal oscillator test system, comprising the steps of:

[0024] Step 1: Define two measurement identifiers.

[0025] In order to realize the function of simultaneously measuring different types of DUTs in the quartz crystal oscillator test system, the present invention first defines two measurement identifications, one is "measurement channel status identification", and the other is "measurement basis identification of the DUT". . in:

[0026] "Measurement channel status identification" has three states: one is to use the number "0" to indicate that the measurement channel has not been added to the DUT, and the other is to use the number "1" to indicate that the measurement channel has been added to the DUT and the DUT is not powered on. The third is to use the number "2" to indicate that the measurement channel has been added to the DUT, and ...

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PUM

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Abstract

The invention discloses a method for simultaneously measuring measured pieces in different types in a quartz crystal oscillator testing system. According to the method, the problem that general and high-stability crystal oscillator measured pieces cannot be measured simultaneously in the conventional system is mainly solved. The method comprises the following realization steps: firstly, before measurement of the quartz crystal oscillator testing system, inputting information of the measured pieces in different types according to the promotion; secondly, after measurement of the quartz crystal oscillator testing system, measuring the relative average frequency deviation of the measured pieces in different types according to the time interval for one hour; thirdly, measuring the performance of a general crystal oscillator measured piece according to the JJG180-2002 verification regulation, wherein measurement data is effective data; and fourthly, measuring the performance of a high-stability crystal oscillator measured piece according to the JJG181-2005 verification regulation and extracting effective measurement data of measurement data of the high-stability crystal oscillator measured piece to obtain the required useful measurement data. The method disclosed by the invention has the advantages of high measuring efficiency and measuring equipment conservation and can be used for simultaneously measuring the general and high-stability crystal oscillator measured pieces.

Description

technical field [0001] The invention belongs to the technical field of measurement, and relates to a method for realizing simultaneous measurement of ordinary and high-stable crystal oscillators by a quartz crystal oscillator test system, which can be used for measurement verification, calibration, measurement, testing, inspection and production of quartz crystal oscillators. Background technique [0002] Quartz crystal oscillators are divided into two categories according to the verification objects corresponding to the national verification regulations: ordinary crystal oscillators and high-stable crystal oscillators. The verification procedure corresponding to the ordinary crystal oscillator is "JJG180-2002 Verification Regulations for Quartz Crystal Oscillators in Electronic Measuring Instruments". The main parameters measured are: power-on characteristics, daily frequency fluctuations, 1-second frequency stability, frequency reproducibility, and frequency accuracy . Th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 黄河
Owner NO 20 RES INST OF CHINA ELECTRONICS TECH GRP
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