Method of automatic generation of test program based on ate and method of ate test

Abstract

The invention discloses an automatic testing program generating method based on ATE (Automatic Test Equipment), and an ATE testing method. The automatic testing program generating method comprises an automatic forward testing program generating method and an automatic reverse configuration file generating method. The automatic reverse configuration file generating method comprises the steps of reversely generating a novel configuration file and a novel template library according to the existing testing program. The automatic forward testing program generating method comprises the following steps of: analyzing and decomposing the composition structure of the testing program of the ATE so as to generate a plurality of configuration files and a plurality of template libraries; generating a unified configuration file and a common template library according to the configuration files and the template libraries generated in the first forward generating step; compiling an automatic generation tool according to the unified configuration file and the common template library generated in the second forward generating step; outputting the novel configuration file and the novel template library by the automatic reverse generating method for the configuration file; and generating a testing program by virtue of the automatic generation tool complied by the third forward generation step and the current configuration file compiled by the fourth forward generation step.

Description

technical field [0001] The present invention relates to the field of integrated circuit testing. More specifically, the present invention relates to a method for automatically generating test programs based on ATE. In addition, the present invention also relates to an ATE test method using the method for automatically generating test programs based on ATE. . Background technique [0002] Integrated circuit testing is a key link in the development and production of integrated circuits. With the increase of the complexity of integrated circuits, the test program development time and test program debugging time are getting longer and longer, which has a great impact on the progress of integrated circuit development and production. [0003] ATE (automatic test equipment, automatic test equipment) test program development is carried out with the support of the development software provided by the ATE manufacturer. The development software supports the development of each test it...

AI Technical Summary

Problems solved by technology

As the complexity of integrated circuits increases, the test program development time and test program debugging time are getting longer and longer, which has a great impact on the progress of integrated circuit development and production.

[0003] ATE (automatic test equipment, automatic test equipment) test program development is carried out with the support of the development software provided by the ATE manufacturer. The development software supports the development of each test item, and each test item includes many The test parameters and test call library, a test program is composed of many test items, and the execution, jump and classification information among the test items are interleaved. If the test program is generated according to the development process of the development software, the development time will be shorter. It costs a lot, and due to the large number of test parameters, errors are prone to occur during the test program development process, resulting in the failure of program debugging

Especially for test programs with more than a thousand test items, the development workload is huge. If the test items need to be modified or added during the debugging process, the corresponding workload is also very large, which will seriously affect the progress of the test.

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