Unlock instant, AI-driven research and patent intelligence for your innovation.

Testing structure

A test structure and test device technology, applied in digital transmission systems, electrical components, transmission systems, etc., can solve the problems of narrow application range and large equipment investment, and achieve the effect of reducing equipment investment, less equipment investment, and simple erection environment

Active Publication Date: 2013-03-20
SERCOMM ELECTRONICS SUZHOU CO LTD
View PDF2 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the communication protocol is a relatively simple protocol, multiple network cards can be added to a PC, and the socket can be used to bind the specified network card to achieve the purpose of accessing different tested products at the same time, but this method has several limitations: it can only be applied to chain The application scope of the network layer protocol is too narrow; while a general PC can only connect 4-5 network cards, if there are more, you need to buy a more expensive industrial-grade multi-slot PC, and the investment in equipment is large.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing structure
  • Testing structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0015] A kind of testing structure of the present invention, comprises testing device, tested product 3, connecting device, and testing device and tested product 3 are respectively connected with connecting device; Tested product 3 is provided with at least two, the MAC address of each tested product same.

[0016] The test device is a PC device 1 . The connecting device is a router 2, the router 2 includes a WAN port 4, at least two...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a testing structure which comprises a testing device, at least two to-be-tested products and a connecting device, wherein the testing device and the to-be-tested products are connected with the connecting device respectively, and MAC (Media Access Control) addresses of the to-be-tested products are the same. With the adoption of the technical scheme, the testing structure has the benefits that the erection environment is simple, the equipment investment is less, support applications are more, one testing device can test multiple to-be-tested products with the same MAC addresses simultaneously and can support any protocol above a network layer after different IPs (Internet Protocol) are obtained through a DHCP (Dynamic Host Configuration Protocol), the testing efficiency can be improved, and the equipment investment can be reduced.

Description

technical field [0001] The invention relates to a test structure, in particular to a test structure for simultaneously testing a plurality of tested products with the same MAC address. Background technique [0002] When conducting product testing in manufacturing plants, in order to improve efficiency, it is often necessary to test multiple products at the same time. If the MAC addresses of the products are the same, it will bring difficulties in setting up the test environment. For this reason, the most primitive method is to test one product under test with one PC, which will use many PCs and require a large investment in equipment. If the communication protocol is a relatively simple protocol, multiple network cards can be added to a PC, and the socket can be used to bind the specified network card to achieve the purpose of accessing different tested products at the same time, but this method has several limitations: it can only be applied to chain The scope of applicat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H04L12/26
Inventor 薛卫华
Owner SERCOMM ELECTRONICS SUZHOU CO LTD