Method and device for controlling circuit testing

Abstract

An embodiment of the invention discloses a method and device for controlling circuit testing. The method includes that after entering a testing mode, a first testing command and a first testing mode signal corresponding to the first testing command are received, the first testing command is matched with a preset command, and if matching succeeds, the first testing mode signal is input into a system-on-chip (SOC) chip so as to test a first testing item corresponding to the first testing mode signal on the SOC chip. Correspondingly, an embodiment of the invention further discloses a device for controlling the circuit testing. By means of the method and device, the testing mode signal is controlled to enter the SOC chip by using the testing command, conditions for starting SOC chip testing items are increased, and SOC chip safety is improved. Simultaneously, switching of testing items can be achieved directly by inputting corresponding testing commands and testing mode signals so that a testing process is simple.

Description

technical field [0001] The present invention relates to the technical field of microelectronic chips, and more specifically, relates to a circuit test control method and device. Background technique [0002] SOC (System On a Chip) refers to the integration of a complete system on a single chip, including necessary functional modules, for example, digital logic modules include: central processing unit, bus unit; analog modules include: memory, power supply system , Clock crystal oscillator. Due to the high-efficiency integration performance of SOC, SOC has become the main solution to replace integrated circuits, and has become an inevitable trend in the development of current microelectronic chips. [0003] In the production process of general chips, it is necessary to test the modules of each part of the chip separately, so as to judge whether the chip is good or bad. In the chip test mode, all resources in the chip are open and not protected by permissions. Attackers will...

AI Technical Summary

Problems solved by technology

The above method of entering the SOC test is too simple, which greatly threatens the security of SOC chip information and data. At the same time, the way of converting test items is cumbersome, making the test process very inconvenient

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