A three-dimensional near-field scanning system
A near-field scanning and three-dimensional technology, applied in the field of three-dimensional near-field scanning systems, can solve the problems of inaccurate positioning and low test efficiency, and achieve the effect of accurate positioning and improved efficiency.
Active Publication Date: 2016-08-31
KUANG CHI INST OF ADVANCED TECH +1
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Problems solved by technology
[0004] The technical problem to be solved by the present invention is to provide a three-dimensional near-field scanning system for the defects of low test efficiency and inaccurate positioning of the existing three-dimensional near-field scanning system
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[0027] The three-dimensional near-field scanning system of the present invention includes such as figure 1 The feed source 10 shown for generating electromagnetic waves, the acquisition unit 2, the analysis unit 3, the first positioning device for supporting the feed source, the second positioning device 4 for supporting the acquisition unit, and the The third positioning device of the medium plate 1, the processing unit 6 and the control unit 5. Because the structures of the first positioning device and the third positioning device are the same as those of the second positioning device. Therefore, the first positioning device and the third positioning device are omitted in the figure. The acquisition unit 2 is used to collect electromagnetic wave signals in its vicinity and send them to the analysis unit 3; the analysis unit 3 is used to convert the received electromagnetic wave signals into digital signals and send them to the processing unit 6; The control unit 5 controls...
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The invention relates to a three-dimensional near-field scanning system which comprises a feed source, a first positioning device used for supporting the feed source, a collection unit, a second positioning device used for supporting the collection unit, a third positioning device used for supporting a dielectric slab to be tested, an analyzing unit, a processing unit and a control unit. The analyzing unit is used for converting received electromagnetic wave signals to digital signals and transmitting the digital signals to the processing unit. The processing unit is used for processing the received digital signals. The control unit controls the first positioning device, the second positioning device and the third positioning device and leads the feed source, the collection unit and the dielectric slab to be tested to be capable of moving in the three-dimensional space. In the three-dimensional near-field scanning system, the positions of the feed source, the dielectric slab to be tested and the collection unit can be three-dimensionally adjusted and are automatically adjusted by aid of the control unit without manual adjusting, and therefore test efficiency is improved, and position locating of the feed source, the dielectric slab to be tested and the collection unit is very accurate.
Description
technical field [0001] The invention relates to the field of electromagnetic field detection, and more specifically, to a three-dimensional near-field scanning system. Background technique [0002] To measure the response characteristics of a dielectric plate to electromagnetic waves, it is necessary to use a feed source to emit electromagnetic waves, and then use a collection device to collect the electromagnetic characteristics of the electromagnetic waves emitted by the feed source after passing through the dielectric plate at various points in space, and then use the processing The equipment records and analyzes the detected electromagnetic characteristic values of each point in space, and deduces the response characteristics of the dielectric material to electromagnetic waves by comparing the changes in the electromagnetic parameter characteristics of the plate with and without the dielectric. [0003] The above process needs to be completed by a three-dimensional nea...
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IPC IPC(8): G01R29/08
Inventor 刘若鹏季春霖杨松涛
Owner KUANG CHI INST OF ADVANCED TECH