Classification method aiming at small sample and high dimensional images

A classification method and small sample technology, applied in the fields of instruments, character and pattern recognition, computer parts, etc., can solve the problems of unsatisfactory high-dimensional image classification effect, difficult debugging and maintenance, complex input parameters, etc., and achieve great scientific research value. With the application value, easy to use and maintain, the effect of less input parameters

Inactive Publication Date: 2013-04-10
CHINA UNIV OF GEOSCIENCES (WUHAN)
View PDF4 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

After years of development, image classification methods have been applied to various fields, such as geographic information classification, steel surface defect recognition, fabric surface defect recognition, wood surface defect recognition, agricultural product classification and recognition, etc., but in the field of industrial image classification, such as However, the existing methods have the following defects in the image recognition of strip surface defects: (1) the classification effect for high-dimensional images is not ideal; (2) the classification rate is not high when the training samples are small compared to the images to be classified; (3) The input parameters are complex, different parameters seriously affect the recognition effect, and cause difficulties in debugging and maintenance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Classification method aiming at small sample and high dimensional images
  • Classification method aiming at small sample and high dimensional images
  • Classification method aiming at small sample and high dimensional images

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The present invention will be further described below in conjunction with drawings and embodiments.

[0033] A classification method for small samples and high-dimensional images, refer to figure 1 , including the following steps:

[0034] (1) Obtain the first classification rule: select the image as the training set, and perform image feature extraction processing on the training set. The image features include shape features, color features, position features and centroid features, and then make the processed training set enter the first-level classification device to obtain the first classification rule, the first-level classifier is designed using a feature description method, the first classification rule adopts the understanding of the image type by expert experience decision-making, and expresses the image type through feature description decision-making, because many defects are processed Due to the process, the cause of formation is relatively fixed, or there ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a classification method aiming at small sample and high dimensional images. The classification method aiming at the small sample and high dimensional images comprises the following steps: (1) gaining a first classification rule, (2) classifying images on a first level, (3) gaining a second classification rule, (4) classifying the images on a second level, (5) gaining a third classification rule, (6) classifying the images on a third level and gaining a classification result. The classification method aiming at the small sample and high dimensional images is combined with characteristics of industrial manufacture. The first-level image classification has strong manual controllability, and meanwhile combines a manifold dimensionality reduction method and superiorities of a support vector machine, thereby being suitable for the classification of the small sample and high dimensional images. Through combining a direct expression method of image type, the manifold dimensionality reduction method, and a support vector machine classification method with an arborescence topological structure classification method based on position features and barycenter features, a three-level image classification method is established. Due to the fact that the data transmission quantity between the image classifiers of the three levels is small, efficiency can not be affected. The classification method aiming at the small sample and high dimensional images is simple in operation, good in algorithm connection and few in input parameters.

Description

technical field [0001] The invention relates to an image classification method, in particular to a classification method for small samples and high-dimensional images. Background technique [0002] The image classification method is an image processing method that distinguishes different types of objects according to the different characteristics reflected in the image information. It uses computer to quantitatively analyze the image, and classifies the image or each pixel or area in the image into one of several categories to replace human visual interpretation. After years of development, image classification methods have been applied in various fields, such as geographic information classification, steel surface defect recognition, fabric surface defect recognition, wood surface defect recognition, agricultural product classification and recognition, etc., but in the field of industrial image classification, such as However, the existing methods have the following defect...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
Inventor 甘胜丰王典洪孙林丁兆一雷维新
Owner CHINA UNIV OF GEOSCIENCES (WUHAN)
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products