A kind of el test connection device
A technology for testing connections and testers, which is applied in the direction of measuring device shells, optical test defects/defects, etc., which can solve problems such as test failure, copper sheet displacement, and junction box installation failure, so as to reduce the probability of contact positions and improve The generality of EL test and the effect of improving the test success rate
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[0024] In order to further understand the present invention, preferred embodiments of the present invention are described below in conjunction with examples, but it should be understood that these descriptions are only to further illustrate the features and advantages of the present invention, rather than limit the claims of the present invention.
[0025] The invention provides an EL test connection device, which can improve the EL test success rate of solar cells and also improve the universality of EL tests for different solar cells.
[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without mak...
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