Turn-on characteristic testing apparatus of large power semiconductor device
A characteristic test and semiconductor technology, applied in the field of power electronics, can solve problems such as economic losses and potential safety hazards, and achieve the effects of comprehensive functions, high reliability, and improved test accuracy
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[0022] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0023] Such as Figure 1-Figure 3 , the present invention provides a high-power semiconductor device turn-on characteristic test device, the device includes a constant current source unit, a test main circuit unit, a heating circuit unit and a protection circuit unit; the test main circuit unit includes an adjustable capacitor C, a damping The R-D1 branch and the adjustable reactor L formed by the resistance R and the diode D1 in series; the constant current source unit outputs a direct current to charge the adjustable capacitor C, and the adjustable capacitor C is charged to the test voltage. The discharge and the adjustable reactor L resonate to generate a test current to realize the opening test of the high-power semiconductor device under different working conditions; the heating circuit unit heats the high-power semiconductor device to the test junction ...
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