Integrated circuit test equipment

Abstract

The invention provides a testing device for an integrated circuit, and the testing device for the integrated circuit includes a main control module and at least one subordinate field programmable gate array (FPGA), wherein the main control module is used for operating an embedded operating system and a testing program, and for sending control commands, and the FPGA is connected with the main control module and a secondary plate of the integrated circuit to be measured, and suitable for gaining tested data of the secondary plate of the integrated circuit to be measured according to the control commands, and for passing the tested data back to the main control module. The device connects the secondary plate of the integrated circuit to be measured to the subordinate FPGA, and the subordinate FPGA is connected with the main control module through a high-speed interface. A plurality of pins which can be matched with users except for a clock pin and a power supply pin in the subordinate FPGA is suitable for being connected with the secondary plate of the integrated circuit to be measured so as to solve the problems that the main control FPGA is directly connected with the secondary plate of the integrated circuit to bring out the limited number of the port provided for users, and therefore the secondary plate of the integrated circuit which is provided with a large number of pins cannot be tested.

Description

technical field [0001] The invention relates to the field of integrated circuits, in particular to a testing device for integrated circuits. Background technique [0002] Field Programmable Gate Array (Field Programmable Gate Array, FPGA) is a field programmable gate array device often used in the process of integrated circuit design and chip testing. It has the characteristics of high integration, small size, and repeatable download configuration. By using the hardware description language, the designer inputs and simulates the circuit function to be constructed in the host computer through the program, and then generates the configuration file and downloads it to the FPGA to realize the corresponding function. The circuit-level design can be conveniently and quickly realized through the FPGA. At the same time, the FPGA can repeatedly download configurations and make online modifications many times, which saves time and cost for the research and development of ASICs and chi...

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention provides a kind of integrated circuit testing device, provides a large number of user interfaces, solves the limited number of user I / O ports reserved by the main control FPGA, and the number of external user interfaces connected to the integrated circuit testing device Interface bottlenecks are encountered with many integrated circuit daughter boards, which further makes it difficult to test integrated circuit daughter boards with a large number of interfaces

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