Hot/cold test equipment for nand flash memory with dehumidifying function

A cold test and flash memory technology, applied in the field of non-flash memory test devices, can solve the problem of not performing low temperature test, and achieve the effect of suppressing moisture and improving the reliability of selection

Inactive Publication Date: 2013-06-05
ENC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Also, existing temperature laboratory checks primarily perform high temperature testing, not low temperature testing

Method used

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  • Hot/cold test equipment for nand flash memory with dehumidifying function
  • Hot/cold test equipment for nand flash memory with dehumidifying function
  • Hot/cold test equipment for nand flash memory with dehumidifying function

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Experimental program
Comparison scheme
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Embodiment Construction

[0027] Next, a heat / cold test device for non-flash flash memory with a dehumidification function according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings.

[0028] refer to figure 1 and figure 2 , The heat / cold test device 100 of the present invention is configured to include a mounter 110, a box 130, and a temperature display 160 in this order from the lower side.

[0029] A Nand Flash Memory to be tested is accommodated in the mounter 110, and by applying electrical characteristics to the memory on the mounter 110, it is possible to know whether the memory is good or defective. A plurality of sockets 115 are mounted on the upper surface of the mounter 110 , and memories are built in these sockets 115 .

[0030] The box 130 located on the upper side of the installer 110 descends to the side of the installer 110 along the vertical guide 120 to close with it, or rises to separate from the installer 110, and th...

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Abstract

Disclosed herein is hot / cold test equipment for a Nand Flash Memory. The test equipment includes a mounting unit that contains the Nand Flash Memory together with a socket to test whether the memory is defective or not, a chamber provided above the mounting unit and moving up and down to come into contact with the socket and thereby provide a target temperature, and a temperature display displaying the target temperature. The chamber includes a block inserted into the socket, a thermoelectric element seated on an upper portion of the block, a water jacket seated on an upper portion of the thermoelectric element and circulating cooling water therein, and a cooling fan provided in the water jacket to blow air downwards, with a discharge hole being formed on a lower surface of the block to discharge nitrogen gas.

Description

technical field [0001] The present invention relates to a test device for Nand Flash Memory, in particular to a hot / cold test device for Nand Flash Memory that can not only perform a thermal test but also perform a cold test and has a dehumidification function. Background technique [0002] In the semiconductor production process, the most difficult problem is that temperature tests need to be performed accurately and quickly, so there is an urgent need for a temperature test inspection device for maximizing productivity. [0003] However, in such experimental equipment, the problem of high efficiency has become prominent, and in recent various researches, the development of nanotechnology has been intensified, and research on inventions in the field of thermoelectric elements that can realize clean energy is being actively carried out. Accordingly, it is also necessary to develop a low-cost and high-efficiency thermoelectric element temperature experimental inspection devic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/00
CPCG01R31/2874G11C29/00G01R31/2862G01R31/28G11C29/56016
Inventor 金斗汉
Owner ENC TECH
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