Appearance inspection apparatus of workpiece and appearance inspection method of workpiece

Abstract

The invention provides an appearance inspection apparatus of workpieces and an appearance inspection method of workpieces, which can correctly position the workpieces on a conveyor table and do not generate electrostatic damage and / or characteristic degradation to the workpieces. The appearance inspection apparatus of workpieces has a straight line feeder which conveys hexagonal workpieces, a conveyor table which transfers and conveys the workpieces from the straight line feeder, a transfer column alignment unit which transfers the workpieces from the straight line feeder to the conveyer and aligns the workpieces into columns, a live unit which enable a lower surface of the conveyor table to be charged so as to maintain the workpieces, and a photographing unit which photographs six faces of each workpiece. The transfer alignment unit has a non-vibration part which is positioned between the straight line feeder and the conveyor, and a column alignment guiding body which aligns the workpieces into columns. The column alignment guiding body comprises a guiding surface which is a straight line when being overlooked. A vacuum pumping unit for pumping vacuum of gaps between the conveyor and the column alignment guiding body is arranged.

Description

technical field [0001] The present invention relates to a workpiece appearance inspection device and a workpiece appearance inspection method that photograph a hexahedron of the workpiece while conveying the hexahedron workpiece. Background technique [0002] Conventionally, as an appearance inspection device for chip-shaped electronic components such as hexahedral resistors and / or capacitors (hereinafter referred to as "workpiece"), a device is known in which the workpiece is placed on a transport table made of a transparent body such as glass, While rotating the conveyor table to convey the workpiece, each surface is photographed by an imaging unit such as a camera for visual inspection. [0003] In this case, the workpiece conveying table of the visual inspection device electrostatically attracts and conveys the workpiece. [0004] That is, first, the workpiece is electrified on the linear feeder that conveys the workpiece in a row by vibration, the workpiece is placed o...

AI Technical Summary

Problems solved by technology

However, it is not limited to when transferring the workpiece on the linear feeder to the conveying table, the workpiece is transferred upward in a certain direction, and the posture of the workpiece is fixed by electrostatic adsorption after transfer, so it is possible that each workpiece may be Minor differences in poses lead to a decrease in shooting accuracy

[0009] In addition, since the workpiece is charged while conveying the workpiece in the linear feeder, the workpiece may be attracted to the linear feeder by electrostatic adsorption during conveyance, resulting in a decrease in conveying speed, and in the worst case, the workpiece stops.

[0010] The second problem is that the electrostatic adsorption force decreases after the workpiece is transferred

Therefore, a part of the charge of the workpiece immediately before being transferred to the transfer table may be neutralized, and in this case, the electrostatic attraction force acting on the workpiece placed on the table is reduced.

[0012] The third problem is that the influence of static electricity on the workpiece

Due to the above-mentioned workpiece transfer and contact between the workpiece mounting surface and the workpiece, the neutralization of the charge is carried out with the movement of the charge, so the electrostatic destruction of the workpiece or the deterioration of the characteristics may occur.

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