Measuring device for tool parameters of a two-dimensional image measuring instrument
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- UNIV OF SHANGHAI FOR SCI & TECH
- Publication Date
- 2015-09-30
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a tool measuring device, in particular to a tool parameter measuring device for a two-dimensional image measuring instrument. Background technique
[0002] Now there are a large number of two-dimensional image measuring instruments on the market. This instrument is suitable for all application fields aimed at two-coordinate measurement. It is widely used in industries such as machinery, electronics, instrumentation, hardware, and plastics. These instruments are generally used in When leaving the factory, the workbench is not equipped with any fixtures or the fixtures are too simple. Manufacturers of milling cutters and drills are typical representatives. Such instruments are widely used in the production process to measure tool parameters. However, due to the lack of special fixtures, it is inconvenient to operate during the measurement process, resulting in low production efficiency and greatly reducing enterprise benefits. ...