Time-delay measurement method for pulsar cumulative pulse profile using sparse representation
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XIDIAN UNIV
- Publication Date
- 2015-11-11
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of signal processing, and relates to a method for measuring the time delay of pulsar cumulative pulse contours, which can be used for X-ray pulsar navigation. Background technique
[0002] X-ray pulsar navigation can provide accurate position, velocity, attitude time and other navigation information for low-earth orbit satellites, interstellar spacecraft and deep space probes, and is not easy to be interfered, so it has broad application prospects and value.
[0003] The basic observation of the X-ray pulsar navigation system is the time difference of arrival (TDOA) of pulsar cumulative pulses from the spacecraft to the center of mass of the solar system. In addition to the resolution of the X-ray detector and the accuracy of the time conversion model, the time delay of the measured pulse profile relative to the standard pulse profile, that is, the time delay of the accumulated pulse profile is a key factor ...