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Component image detection method and system thereof

An image detection and component technology is applied in the field of component image detection methods and systems to achieve the effect of improving detection efficiency

Inactive Publication Date: 2016-04-13
NAT KAOHSIUNG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, the electronic component detection technology of the aforementioned U.S. No. 7,355,692 and No. 6,285,782 patents still needs to be further improved, and there must be a need to further provide high detection rates

Method used

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  • Component image detection method and system thereof
  • Component image detection method and system thereof
  • Component image detection method and system thereof

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Embodiment Construction

[0025] In order to fully understand the present invention, preferred embodiments are exemplified below and described in detail with accompanying drawings, which are not intended to limit the present invention.

[0026] The (electronic) component image detection method and its system of the preferred embodiment of the present invention are suitable for identifying or detecting the appearance of various electronic components or related products, such as: assembled from various types of non-electronic components, various types of electronic components (parts) Assembly or the appearance of semi-finished products or electronic products (finished products) made by assembling non-electronic components and electronic components can also be applied to various related product processes, such as: assembly line (assembling line), but it is not used for define the scope of the invention.

[0027] figure 1 A schematic diagram illustrating a component image inspection method according to a ...

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Abstract

The invention relates to an element image detection method which comprises the following steps of: inputting an element image, applying a singular value decomposition method to the element image so as to obtain a decomposition element image, and performing image detection by utilizing the decomposition element image. The other better embodiment of the invention is refers to that at least one light compensation factor is calculated by using a light compensation method; light compensation is performed by utilizing the light compensation factor so as to treat the element image to obtain a light compensation element image; image detection is performed by utilizing the light compensation element image. Therefore, the purpose of improving the element detection efficiency can be achieved by using the method.

Description

technical field [0001] The present invention relates to an electronic component image recognition method and system thereof, in particular to a method and system for electronic component image recognition using Singular Value Decomposition (SVD). Background technique [0002] Existing image detection technology for electronic components, for example: U.S. No. 7355692 "System and method for inspecting electrical circuits utilizing reflective and fluorescent imagery" patent, which discloses a method for detecting electronic circuits, which includes: in a first image during a first time interval, by detecting measuring light reflected from at least a portion of an electronic circuit, and optically detecting at least a portion of the electronic circuit; optically detect the emitted light; and indicate defects in the electronic circuit based on geometrically consistent indications generated by not only detecting light reflected from at least a portion of an electronic circuit to ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/956G01V8/10
Inventor 王敬文
Owner NAT KAOHSIUNG UNIV OF SCI & TECH