Method and device for detecting functional performance of integrated chip based on model identification

Abstract

The invention relates to a method for detecting the functional performance of an integrated chip based on model identification. The method comprises the following steps of 1, reading an IBIS (Input / Output Buffer Information Specification) model file through a main control platform, analyzing the model of the chip and the I / O characteristic curve of a first input pin through a model resolving unit, translating the characteristic curve into a parameter value which can be tested, transmitting to a parameter receiving / transmitting unit through a command, sending the command to a signal simulating and detecting device, making a microprocessor of the signal simulating and detecting device generate a simulation voltage or a logical level according to a control signal source, and transmitting to the input pin of a chip to be detected via a pin driving and protecting circuit of the chip to be detected; and 2, starting a high-speed ADC (Analog-Digital Converter), reading and recording the parameter value of the output pin end of the chip to be detected in real time, starting the parameter receiving / transmitting unit for receiving current group output information, and saving. According to the method and the device, an IBIS model is taken as the testing basis of the integrated chip, so that a special SCPI (Standard Command for Programming Instrument) file is not required to be acquired. The functional and performance testing of any chip can be realized.

Description

technical field [0001] The invention relates to a detection technology, and relates to a method for real physical detection according to an IBIS model of an analog and digital integrated chip. Background technique [0002] In the process of scientific research and production, it is necessary to identify whether various devices are damaged or not and to screen for performance. For this reason, it is very necessary for a chip detection system to complete this work. There are two existing chip testing systems and methods, one is to perform functional testing on the integrated chips with specific functions produced, such as the chip testing system and chip testing method described in the patent number 200610139145.5, the patent number is 200710002298.X The chip testing system and testing method described in the patent No. 201010153051.X is based on the script control chip testing method, device and system; the other is a man-machine with a single-chip microcomputer as the core ...

AI Technical Summary

Problems solved by technology

The former is mainly for the detection of integrated chip products produced, and only for certain functional chips. Although the test is comprehensive, the types of chips involved are very small. Even if the chip detection method is based on script control, the script is the standard command SCPI of programmable instruments. , the acquisition of this script is not open, and it is not suitable for real-time detection of multiple devices; the latter can detect more integrated chips with a single-chip microcomputer as the core, but with the increase in the number of detection chips, the required chip test incentive algorithm and The amount of code increases sharply, which finally makes it difficult for the system resources of the single-chip microcomputer to accommodate

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