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Double-microcontroller

A dual-microcontroller, industrial control technology, applied in electrical program control, program control in sequence/logic controllers, electrical testing/monitoring, etc., can solve the problem of unreasonable interface definition, unstable equipment performance, high price, etc. problem, to achieve the effect of large addressing range, fast communication speed and low cost

Inactive Publication Date: 2013-10-30
李尔汽车电子电器(上海)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the existing test system imported from abroad is expensive, the secondary development is very difficult, and the maintenance cost is high
Or the performance of some equipment provided by local equipment developers is unstable, the interface definition is unreasonable, the development interface is not friendly, and it is not universal and interchangeable, causing a lot of waste

Method used

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Embodiment Construction

[0023] refer to Figure 1-Figure 2 , the specific embodiment adopts the following technical solutions: it includes an industrial control computer 1, an analog input and output card 2, a high-side output terminal 3, a low-side output terminal 4, a programmable resistance board 5, an automotive electronic general communication interface module 6, Program-controlled power supply 7, high-precision multimeter 8, large-scale switch matrix 9 and program-controlled load box 10, industrial control computer 1 is connected with analog input and output card 2, analog input and output card 2, high-side output terminal 3, and low-side output terminal 4. Programmable resistance board 5, automotive electronic general communication interface module 6, and program-controlled power supply 7 are all connected to the sample to be tested 11, and the sample to be tested 11 is connected to the program-controlled load box 10, and the program-controlled load box 10 is connected to the large-scale switch...

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PUM

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Abstract

The invention relates to the technical field of automobile measuring equipment, and provides a double-microcontroller. An industrial control computer of the double-microcontroller is connected with an analog input and output card. The analog input and output card, a high side output end, a low side output end, a programmable resistance plate, an automotive electronics general communication interface module and a programmable power supply are all connected with a sample piece to be measured, the sample piece to be measured is connected with a programmable load box which is connected with a large-scale switching matrix, the large-scale switching matrix is connected with a high precision universal meter, and the high precision universal meter is connected with the programmable power supply. The double-microcontroller can meet measuring requirements of multiple automotive electronics modules (BCM and SJB) and can upload measured data to a factory information management system at the same time. Administrative staff or technical staff can check production conditions of various measurement stations in real time, and meanwhile the double-microcontroller provides a historical query function.

Description

Technical field: [0001] The invention relates to the technical field of automobile measuring devices, in particular to an automobile electronic dual microcontroller. Background technique: [0002] With the development of the economy, people have higher and higher requirements on the comfort, reliability, energy saving and other aspects of the car, and a large number of electronic control units are used in the car. BCM and SJB, as body control and power distribution control units, are complex electronic devices with multifunctional inputs and outputs. The use environment is very harsh and complex, the product circuit and software are very complex, the peripheral interface is extremely rich, and the manufacturing process is complicated. Strict testing must be carried out before the product goes offline to ensure that the product is free from defects. Test engineers face many challenges when designing and developing suitable test systems. [0003] At present, the existing tes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/05G05B23/02
Inventor 张春王斌峰
Owner 李尔汽车电子电器(上海)有限公司
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