Test system and test method for measuring AC-LED junction temperature

A technology of AC-LED and test system, applied in the direction of single semiconductor device test

Inactive Publication Date: 2013-12-04
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

It can be known that the traditional AC-LED junction temperature test is only an estimation method

Method used

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  • Test system and test method for measuring AC-LED junction temperature
  • Test system and test method for measuring AC-LED junction temperature
  • Test system and test method for measuring AC-LED junction temperature

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Embodiment

[0029] A Test System for Measuring AC-LED Junction Temperature

[0030] figure 1 It is a structural schematic diagram of the present invention, such as figure 1 As shown, a test system for measuring the AC-LED junction temperature includes: a computer 100 , a programmable pulse current source 200 , a constant temperature box 300 , and a thermometer 400 . The alternating current AC-LED is set in the constant temperature box 300 .

[0031] A test method for a test system for measuring the AC-LED junction temperature, comprising the following steps:

[0032] Similar to measuring the DC DC-LED junction temperature with the pulse method, a calibration process is first performed on the AC-LED to be tested. The AC-LED is heated at different temperatures. After the heat is balanced, the chip of the AC-LED is fully heated at this time, and the temperature of several chips in the AC-LED is the same. Approximately, the ambient temperature at this time can be regarded as the junction...

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Abstract

The invention discloses a test system for measuring AC-LED junction temperature and a test method for measuring AC-LED junction temperature. The system includes a computer, a programmable pulse current source controlled by the computer, a thermostat and thermometer. An existing pulse method for testing LED junction temperature can be only applied to DC-LEDs, while the test system and the test method for measuring the AC-LED junction temperature can be ingeniously applied to AC-LED junction temperature testing. According to the test system of the invention, the programmable pulse current source is adopted, and therefore, the test system has the advantages of simple structure, convenient operation and easiness in measurement, and has higher accuracy compared with an alternating current virtual value valuation method.

Description

technical field [0001] The invention relates to LED design and application technology, and relates to a test system and a test method for measuring the AC-LED junction temperature. Background technique [0002] AC-powered light-emitting diodes (also known as AC-LEDs) eliminate the need for costly AC / DC converters and constant current sources, and are more energy-saving, longer-lived, and more energy-efficient. The lighting market expands. At present, the theory and testing of ordinary DC-LEDs have been relatively perfect, and the junction temperature can be measured more accurately. However, the AC-LED power supply is constantly changing, and the accurate relationship curve between current or voltage and junction temperature cannot be obtained, so there is no relatively high-precision testing method so far. [0003] The effective value estimation method usually used in the existing AC-LED junction temperature test experiment. Put the LED in an incubator and make the junct...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
Inventor 张大伟吴奉炳张文君翟保才曹民许键
Owner UNIV OF SHANGHAI FOR SCI & TECH
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