System for testing fatigue in high/low temperature environment
A low-temperature environment and testing system technology, applied in the direction of applying repetitive force/pulsation force to test the strength of materials, can solve problems such as lack and immaturity
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specific Embodiment approach 1
[0023] Specific implementation mode one: combine Figure 1 to Figure 6 Specific embodiments of the present invention will be described.
[0024] The present invention is a fatigue test test system under high / low temperature environment, which is composed of a fatigue testing machine 1, a conversion joint 2, a sample fixture 5, a high / low temperature environment box 3, a positioning pin 7, a liquid nitrogen tank 6 and a sample 4 . exist Image 6 Among them, the sample holder 5 is connected with the sample 4, and the positioning pin 4 passes through the positioning holes of the sample holder 3 and the sample 4 for positioning, which can ensure that the sample 4 is loaded uniformly in the axial direction; The testing machine 5 is connected to the sample fixture 3; the liquid nitrogen tank 6 is connected to the high / low temperature environment box 3 to form a fatigue test system under high / low temperature environment.
[0025] In the high / low temperature fatigue test, the desig...
specific Embodiment approach 2
[0026] Embodiment 2: The difference between this embodiment and Embodiment 1 lies in the design of the sample. The sample can be a plate with or without holes in the center, and the dimensional parameters can be different from those in Embodiment 1. , the other design concepts and connection methods of the fatigue test test system under high / low temperature environment are the same as those in the first embodiment.
specific Embodiment approach 3
[0027] Specific embodiment three: the difference between this embodiment and specific embodiment one lies in the design of the sample, the sample can be rod-shaped or other structural forms, other design ideas and connection methods of the fatigue test test system under high / low temperature environment It is the same as the first embodiment.
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