Continuous sample sending device of full automatic impact testing machine
An impact testing machine, a fully automatic technology, applied to conveyor objects, transportation and packaging, etc., can solve the problems of difficulty in sample placement, high requirements for guide frame machining accuracy and positioning accuracy, and inability to achieve continuous sample placement. achieve the effect of reducing processing
Inactive Publication Date: 2013-12-25
JINAN KEHUI TESTING INSTR
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Problems solved by technology
[0004] However, the currently used guide frames have high requirements for machining accuracy and positioning accuracy. If the accuracy requirements are not met, it will be very difficult to place the sample. In actual use, the three guide columns and the The installation position of the positioning rod cannot realize the continuous placement of the sample
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[0015] Such as figure 1 , figure 2 , image 3 As shown, the continuous sample feeding device of the automatic impact testing machine of the present invention includes a base 8, a sample guide frame and a sample jacking cylinder. Both the sample guide body and the top sample cylinder are fixed on the base 8, and the base 8 is provided with a sample guide groove, and the telescopic arm of the top sample cylinder is fixedly connected with a push rod 6 in parallel.
[0016] The body of the sample guide frame includes a vertical plate 1 and L-shaped baffles 2 symmetrically arranged on the left and right sides of the vertical plate 1. The lower end of the L-shaped baffle 2 does not extend to contact with the base 8 but leaves a certain space for the convenience of the push rod The bottom sample. The inner plate surface of the riser 1 is provided with a V-shaped protrusion 3 matching the notch of the impact sample 7 along its height direction, and the riser 1 and the L-shaped baf...
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The invention discloses a continuous sample sending device of a full automatic impact testing machine. The continuous sample sending device comprises a base and a test sample guide frame body arranged on the base, and is characterized in that the test sample guide frame body comprises a vertical plate and L-shaped baffle plates, the L-shaped baffle plates are symmetrically arranged at the left side and the right side of the vertical plate, the inner plate surface of the vertical plate is provided with a V-shaped bulge matched with an impact test sample notch in the height direction of the inner plate surface, the vertical plate and the L-shaped baffle plates arranged at two sides of the vertical plate are simultaneously surrounded into a semi-closed test sample placing cavity, the bottom of the test sample guide frame body is also fixedly provided with a bottom plate, and the bottom plate is fixedly connected onto the base. The continuous sample sending device has the advantages that the integral structure design is adopted among the test sample guide frame body, the base and the L-shaped baffle plates, the processing and positioning difficulty of the test sample guide frame body is reduced, the test sample placement is convenient, and in addition, the continuous test sample placement can be realized.
Description
technical field [0001] The invention relates to a continuous sample delivery device for a full-automatic impact testing machine, which is a sample delivery device for realizing placement and delivery of impact samples. Background technique [0002] The impact test is a test that shows the notch characteristics of the sample by applying an overload stress by one impact. People usually use the pendulum impact testing machine to carry out normal temperature, high temperature and low temperature impact tests on materials. In addition to testing the cold brittleness, hot brittleness and temper brittleness of metal materials, it is also used for material selection, quality control and development of new metal materials. The researched strain sensitivity test, tear test, etc., play a role in ensuring the safety of products or engineering components. [0003] The structure of the guide frame of the currently used sample feeding device is as follows: the guide frame is mainly compos...
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IPC IPC(8): B65G47/82
Inventor 姜德志
Owner JINAN KEHUI TESTING INSTR