Reflection type resonant cavity for measuring sample surface state in profound hypothermia high-intensity magnetic field

A resonant cavity and strong magnetic field technology, applied in resonators, measuring devices, and material analysis using microwave means, can solve problems such as difficult sample corrosion, difficult sample electrode preparation, and sample damage. The method is simple and convenient, and solves the problem of sample The effect of interference on bulk conductance
CN103500870AInactive Publication Date: 2014-01-08SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
Publication Date
2014-01-08
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

The invention discloses a reflection type resonant cavity for measuring the sample surface state in a profound hypothermia high-intensity magnetic field. The reflection type resonant cavity mainly consists of a coaxial cable assembly, a microwave separating plate and panel installing type connector, a resonant cavity cover plate, a resonant cavity, a copper sheet A, a copper sheet B, a screw A, a screw B and the like. The reflection type resonant cavity is mainly characterized in that microwaves are guided into the resonant cavity in the profound hypothermia high-intensity magnetic field environment by coaxial cables, and the combination of the microwave measurement and the profound hypothermia high-intensity magnetic field transporting measurement is realized. The system provides an effective tool for studying the profound hypothermia magnetic transportation of the surface state of two-dimensional nano-structure materials such as topological insulators.
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Description

technical field

[0001] The present invention relates to a reflective resonant cavity, in particular to a reflective resonant cavity for measuring the surface state of a sample, by using a method of measuring the quality factor (Q factor) of the reflective resonant cavity under extremely low temperature and strong magnetic field, Characterize the surface state of the sample in the resonant cavity and study the response characteristics of the surface state of the material to microwaves under non-destructive and non-contact conditions. Background technique

[0002] Among the test methods related to semiconductor materials and devices, magnetic transport is an important and basic research method, which is used to study basic information such as carrier concentration, type and mobility of materials. Under the condition of deep low temperature, many quantum effects appear. As a correction to the classical conductance, the quantum effect of conductance reflects the physical informa...

Claims

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