Biomarker of schizophrenia and use method and application thereof

A metal material, near-surface technology, applied in the direction of optical testing flaws/defects, etc., can solve the problem of inability to detect near-surface defects of metal materials, and achieve the effect of avoiding potential dangers

Inactive Publication Date: 2014-01-15
CHINA SPECIAL EQUIP INSPECTION & RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The invention provides a method and device for detecting near-surface defects of metal materials to solve the technical problem that the prior art cannot detect near-surface defects of metal materials

Method used

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  • Biomarker of schizophrenia and use method and application thereof
  • Biomarker of schizophrenia and use method and application thereof
  • Biomarker of schizophrenia and use method and application thereof

Examples

Experimental program
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Embodiment Construction

[0019] figure 1 It is a flowchart of an embodiment of the method for detecting near-surface defects of metal materials provided by the present invention. Such as figure 1 As shown, the method specifically includes:

[0020] S101, heating the near surface of the workpiece by means of electromagnetically exciting an external heating source;

[0021] The electromagnetic excitation signal may be a high-frequency modulated electrical signal such as a pulse, a step, or a periodic wave, wherein the frequency of the modulated wave may be between 1 kHz and 100 kHz. The electromagnetic excitation signal is loaded on the heating coil, so that an induced electromotive force is generated on the near surface of the workpiece close to the heating coil, and then an induced current is generated on the near surface of the workpiece made of metal material. The induced electromotive force and induced current can be converted into thermal power, thereby realizing heating treatment on the near s...

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PUM

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Abstract

The invention discloses a group of biomarkers for diagnosis of schizophrenia, and the biomarkers can be applied to preparation of detection reagents or detection kits for diagnosis of schizophrenia. Based on the markers, the invention also provides a detection kit, a detection reagent and a chip or array for the diagnosis of schizophrenia, and a method for the diagnosis of schizophrenia by using the markers. The method of the present invention is simple and practical, has reliable diagnosis results and gives consideration to both sensitivity and specificity.

Description

technical field [0001] The invention relates to the technical field of flaw detection, in particular to a method and a device for detecting near-surface defects of metal materials. Background technique [0002] Metal materials are the main raw materials of many industries in our country, and their quality is very important to the quality of their derived products. Due to the influence of many technical factors such as raw materials, rolling process, and use environment, metal materials will produce defects such as cracks and inclusions during the production process and use process, which will reduce the quality of the material. Therefore, it is particularly important to detect defects in metal materials in a timely and effective manner. [0003] In the prior art, an eddy current detection method is adopted, that is, the coil carrying an alternating current will induce an eddy current in the metal material close to it, and the induced eddy current will in turn affect the ori...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 俞跃
Owner CHINA SPECIAL EQUIP INSPECTION & RES INST
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