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A method for forming a double epitaxial layer of a semiconductor device

A semiconductor and epitaxial layer technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of adding steps, cumbersome process steps, and low efficiency

Active Publication Date: 2016-12-21
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, the process steps of epitaxially growing two different semiconductor materials in different regions of the semiconductor substrate are very cumbersome, adding many unnecessary steps, and the efficiency is low, so the current method needs to be improved

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  • A method for forming a double epitaxial layer of a semiconductor device
  • A method for forming a double epitaxial layer of a semiconductor device
  • A method for forming a double epitaxial layer of a semiconductor device

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Embodiment Construction

[0027] In the following description, numerous specific details are given in order to provide a more thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without one or more of these details. In other examples, some technical features known in the art are not described in order to avoid confusion with the present invention.

[0028] In order to thoroughly understand the present invention, a detailed description will be provided in the following description to illustrate the method for preparing a double epitaxial layer of a semiconductor device according to the present invention. Obviously, the practice of the invention is not limited to specific details familiar to those skilled in the semiconductor arts. Preferred embodiments of the present invention are described in detail below, however, the present invention may have other embodiments besides these detailed descriptions.

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Abstract

The invention relates to a method for forming double epitaxial layers of a semiconductor device. The method comprises: providing a semiconductor substrate which at least includes a first gate and a second gate; forming an epitaxial barrier layer on the semiconductor substrate; removing the first gate and the epitaxial barrier layer on a source-drain area at the two sides through etching to expose the semiconductor substrate, and growing a first semiconductor material layer in an epitaxial manner in the source-drain area at the two sides of the first gate to form a first uplift source-drain; removing the residual epitaxial barrier layer through etching and forming a second uplift source-drain in the source-drain area at the two sides of the second gate, wherein a second semiconductor material layer has a higher etching selectivity ratio than the first semiconductor material layer; decomposing a mask material layer on the second gate and the second uplift source-drain; removing the second semiconductor material layer on the first uplift source-drain through etching; and removing the mask material layer. The method provided by the invention is simpler and more efficient.

Description

technical field [0001] The invention relates to the field of semiconductors, and in particular, the invention relates to a method for forming a double epitaxial layer of a semiconductor device. Background technique [0002] When preparing semiconductor devices, it is often necessary to epitaxially grow two different semiconductor materials in different regions of the semiconductor substrate. For example, it is often necessary to epitaxially grow two different semiconductor materials on the source and drain of NMOS and PMOS. Currently, the source and drain of NMOS and PMOS When two different semiconductor materials are epitaxially grown, it is often necessary to form an epitaxial barrier layer twice. The specific method is: provide a semiconductor substrate with source and drain regions and gates of NMOS and PMOS on the substrate. To form a semiconductor material on the NMOS and PMOS sources and drains, it is necessary to deposit and form an epitaxial barrier layer on the sou...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/20H01L21/8238
CPCH01L21/02524H01L21/823418
Inventor 卜伟海
Owner SEMICON MFG INT (SHANGHAI) CORP