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Large-scale spatial free curved surface measurement method

A measurement method and curved surface technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of increasing costs, wasting resources, reducing efficiency, etc., and achieve the effects of good accuracy, high precision, and improved reliable basis

Active Publication Date: 2014-03-19
CHINA ERZHONG GRP DEYANG HEAVY IND
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AI Technical Summary

Problems solved by technology

Although this method can obtain information on the contour and size of the curved surface, due to the low accuracy of the three-dimensional scanning measurement equipment, it cannot meet the accuracy requirements when used for scanning large-scale free-form surfaces, and the products produced will not meet the requirements. Design requirements, resulting in waste of resources, which reduces efficiency and increases costs

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  • Large-scale spatial free curved surface measurement method

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Embodiment Construction

[0016] Such as figure 1 As shown, the preparatory work before measurement includes setting several measuring points 3 and coding points 4 on the measured surface 1. According to the area and the complexity of the shape of the measured surface 1, the number of setting measuring points 3 is also different. The general principle is that the measurement points 3 cover the entire curved surface 1, and the distribution is as uniform as possible. Since code point 4 is a mark used to distinguish the shooting area of ​​each photo on surface 1, it is also a splicing point used to combine photos into a whole, so the setting of code point 4 should satisfy that at least 3 code point 4, and the same code point 4 appears in at least two different photos. A standard ruler 2 is set at a suitable position, and a measuring point 3 is also arranged on the standard ruler 2 , and the distance between the measuring points 3 on the standard ruler 2 is calibrated in advance.

[0017] Before measurin...

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Abstract

The invention provides a large-scale spatial free curved surface measurement method. According to the method, a lot of reflection signs are arranged on a measured curved surface and a digital photogrammetric system is used to measure a physical dimension of the measured curved surface so that a disadvantage of a spatial digitizer on an aspect of dimension measurement is overcome. Under a coordinate system with high precision which is established by the digital photogrammetric system, data collected by the spatial digitizer is corrected so that accuracy of the curved surface dimension is guaranteed and accuracy of a curved surface outline is not influenced. The method comprises the following steps of measurement preparation, image shooting, coordinate system establishment, three dimension scanning and data generation. By using an independent three-dimensional scanning method in the past, scanning precision is not high and data measurement is not accurate. By using the method of the invention, the above disadvantages are overcome. The outline and the dimension of the measured curved surface can reach a high precision requirement. The method is suitable for large-scale spatial free curved surface measurement.

Description

technical field [0001] The invention relates to a method for measuring a free-form surface in a large space. Background technique [0002] In the fields of large-scale mold manufacturing and pipeline laying, it is necessary to measure the actual contour and size of the object. Although many 3D design software can draw the three-dimensional figure of the object, the actual manufactured product is likely to have dimensions or dimensions different from the design drawings. Errors in contour, especially for large curved surface structures. Moreover, when designing corresponding supporting products for larger curved surface structure products, it is even more necessary to know the precise outline and size of the curved surface structure product. Especially in reverse engineering, it is very important to obtain the accurate and real data parameters of the real object for the design model. The current method of measuring free-form surfaces in space is mainly to use a 3D scanner t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 史苏存段玲石小兵
Owner CHINA ERZHONG GRP DEYANG HEAVY IND
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