Time Domain Fast Imaging Method for Bistatic Synthetic Aperture Radar

A technology of synthetic aperture radar and imaging method, which is applied in the field of radar and can solve the problems of large computational load, poor focusing accuracy, and inability to achieve accurate focusing of bistatic SAR.

Active Publication Date: 2016-01-20
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0007] The purpose of the present invention is to address the defects of the background technology, research and design a bistatic SAR time-domain fast imaging processing method, and solve the problem that the bistatic SAR frequency-domain imaging method is limited by the unknown accurate spectrum and the existing bistatic SAR time-domain imaging method Due to the large amount of calculation or poor focusing accuracy, it is impossible to achieve precise focusing of bistatic SAR

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  • Time Domain Fast Imaging Method for Bistatic Synthetic Aperture Radar
  • Time Domain Fast Imaging Method for Bistatic Synthetic Aperture Radar
  • Time Domain Fast Imaging Method for Bistatic Synthetic Aperture Radar

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[0083] The present invention mainly adopts the method of simulation experiment to verify, and all steps, conclusions are verified correctly on Matlab2010, and the bistatic synthetic aperture radar system structural diagram that implementation mode adopts is as follows figure 2 As shown, the method of the present invention will be further described in detail below with regard to specific embodiments, and the schematic flow chart is as follows figure 1 shown.

[0084] Step 1: For any target in the imaging area, calculate the distance history of the receiving station and the distance of the transmitting station, generate BSAR point target simulation echo data, denoted as S(t,τ;x,y), and set this matrix as a square matrix , the parameters required for simulation such as image 3 As shown, the target scenario is as Figure 5 shown. The black dots in the picture are 3×3 9 point targets arranged on the ground. These 9 points are spaced 400 meters apart along the x-direction (cut...

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Abstract

The invention discloses a bistatic synthetic aperture radar fast imaging method in time domain. Specifically, the low-order approximation of the Green's function in the back projection integral function is used to complete sub-aperture full-view imaging, and aperture synthesis and view division are performed through iteration. In each iteration stage, the sub-aperture image of the upper stage is used to synthesize the synthetic aperture image, and finally the full-aperture imaging is completed, thereby realizing the precise focusing of the bistatic SAR. In the time-domain imaging method, the coarse focusing of the sub-image is completed by using the low-order approximation characteristics of the Green's function, and the focusing accuracy is gradually improved through iteration.

Description

technical field [0001] The invention belongs to the technical field of radar, and in particular relates to a bistatic SAR imaging method in the synthetic aperture radar (Synthetic Aperture Radar, SAR) imaging technology. Background technique [0002] SAR is an all-day, all-weather modern high-resolution microwave remote sensing imaging radar. played an increasingly important role. [0003] Bistatic SAR has many outstanding advantages due to the separation of transceivers. It can obtain the non-backscatter information of the target, and has the characteristics of long range, concealment and strong anti-interference. In addition, since the bistatic SAR receiver does not contain high-power devices, it has low power consumption, small size, and light weight, and is easy to carry on various types of aircraft, and its cost is low. In a word, bistatic SAR, as a new means of space observation of the earth, has a broad space for development in both civilian and military fields. ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S13/90
CPCG01S7/41G01S13/90G01S13/9017G01S13/9058
Inventor 武俊杰李中余宋雷权黄钰林杨建宇包毅
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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