Lamp aging test line

An aging test and lighting technology, applied in lighting test, vibration test, machine/structural component test, etc., can solve problems such as low efficiency, insufficient safety, waste of manpower, etc., and achieve the effect of safe and reliable operation and high test efficiency.

Inactive Publication Date: 2014-04-30
DONGGUAN YI CHIA OPTOELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing inspection process is to manually transfer the lamps to each testing instrument for aging test in order to finally screen out defective products. Such operation steps are not only wa

Method used

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Experimental program
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Embodiment Construction

[0023] The present invention will be further described below in conjunction with the accompanying drawings, such as Figures 1 to 7 As shown, the lamp aging test line provided by the present invention includes a frame 1, and the frame 1 is provided with a conveying track 2 for conveying lamps, a driving motor 3, and a transmission mechanism 4, and the output end of the driving motor 3 is driven by the transmission mechanism 4. The conveying track 2 is connected, and the conveying track 2 forms a ring-shaped circulating conveying structure. The conveying track 2 can be a conveying chain, a conveying belt or a conveying roller. In this embodiment, the conveying track 2 is formed by arranging several conveying rollers, and the conveying roller is driven to rotate by the driving motor 3 and the transmission mechanism 4 to drive the tooling plate. 5 Move.

[0024] The conveying track 2 is provided with a tooling plate 5 that is pushed by the conveying track 2 to move along the con...

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PUM

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Abstract

The invention relates to the technical field of lamp test devices, in particular to a lamp aging test line. The lamp aging test line comprises a machine frame, wherein conveying rails, a drive motor and a transmission mechanism are arranged on the machine frame. A tool plate is arranged on the conveying rails, sockets are arranged on the tool plate, and electric conduction strips are arranged on the lower end face of the tool plate. A first aging test area, a vibration test area and a second aging test area are sequentially arranged on the machine frame. Each aging test area comprises multiple wire collection rail assemblies. Each wire collection rail assembly comprises three electric conduction grooves and multiple sets of electric conduction wheel devices. The electric conduction wheel devices make contact with and are connected with the electric conduction strips of the tool plate passing through the portion above the electric conduction strips respectively. The tool plate is conveyed through the conveying rails and can be automatically connected with the wire collection rail assemblies in the different test areas when passing through the different test areas so that corresponding voltages can have access to the tool plate, the high voltage test, the low voltage test, the voltage prevention test, the vibration resistance test and the like can be automatically conducted on a lamp, no manual operation is required in the test process, the test efficiency is high, and the operation is safe and reliable.

Description

Technical field: [0001] The invention relates to the technical field of lamp testing equipment, in particular to a lamp aging test line. Background technique: [0002] In the production process of lamps, in order to ensure the quality of the products, it is necessary to carry out aging and online detection of components. The main method of aging is to make lamps and lanterns in abnormal working environment, such as the environment exceeding or below the rated voltage, for a certain period of time. Lighting work, in the process, the lamps and lanterns whose components are not turned off will be damaged, so that defective products can be screened out; and online detection is to apply high-voltage shocks to the lamps to carry out withstand voltage tests, and to test the power of the lamps. During the test, when the defective product is connected to the high voltage, the components will also be washed out, or during the power test process, it will be screened out because it does...

Claims

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Application Information

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IPC IPC(8): G01R31/44G01M7/02
Inventor 曹菊萍
Owner DONGGUAN YI CHIA OPTOELECTRONICS TECH
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