Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for manufacturing capacitors with large unit capacitance in ordinary LOGIC process

A production method and capacitance technology, which is applied in the direction of capacitors, circuits, electrical components, etc., can solve the problem of not supporting MIM capacitance MOM unit capacitance, etc., and achieve the effect of reducing production costs

Inactive Publication Date: 2014-04-30
常州新超电子科技有限公司
View PDF2 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention aims to solve the problems that MIM capacitors are not supported in many current processes and the unit capacitance of MOM is too small, and provides a method for manufacturing capacitors with large unit capacitances in most common LOGIC processes at present, which does not require additional Adding MASK is just to use the existing MASK to make a capacitor with the largest unit capacitance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for manufacturing capacitors with large unit capacitance in ordinary LOGIC process
  • Method for manufacturing capacitors with large unit capacitance in ordinary LOGIC process
  • Method for manufacturing capacitors with large unit capacitance in ordinary LOGIC process

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0014] At present, many LOGIC processes do not support MIM capacitors, so it is a challenge to make capacitors in the LOGIC process. In addition, even for the process that supports MIM capacitors, an additional layer of MASK is required to make MIM capacitors, which leads to an increase in manufacturing costs and a significant decline in the cost competitiveness of chips. In some LOGIC processes, there are already MOM solutions. This method mainly generates capacitance through the oxide layer (OXIDE) between two metal lines of the same layer. However, the unit capacitance value of the capacitor produced by this method is relatively low. For occasions that require large-capacity capacitors, it can only be realized by increasing the capacitor area, which increases the chip area and increases the chip cost.

[0015] The invention is a method ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for manufacturing capacitors with large unit capacitance in an ordinary LOGIC process. On the basis of MOM capacitors, capacitors of MOS transistors are added. A metal insertion finger is designed for the MOM capacitors according to a minimum process dimension, multiple metal layers are arranged according to the structure of the insertion finger, and the arrangement of the MOM capacitors formed by the different metal layers is completely the same. The MOM capacitors and the capacitors of the MOS transistors are of a perpendicular structure, and the capacitors of the MOS transistors are located below the MOM capacitors. The source electrode and the drain electrode of each MOS transistor are connected to form one end of the corresponding capacitor, and the grid electrode of each MOS transistor forms the other end of the corresponding capacitor. The two ends of each MOM capacitor are connected with the two ends of the capacitor of the corresponding MOS transistor, and therefore a parallel connection frame is formed. According to the method, in the specific process, under the condition that the MASK is not increased, the capacitors with the largest unit capacitance are manufactured. When the method is used, production cost of chips can be obviously reduced under the condition that functions of the chips are ensured.

Description

technical field [0001] The invention relates to the production of large unit capacity capacitors, especially for the production of chips that do not support MIM capacitors and have higher requirements on unit capacity. Background technique [0002] At present, MIM (metal-insulator-metal) capacitors are provided in a few processes, but this requires an additional layer of MASK (mask), which not only increases the one-time production cost of MASK, but also causes 3 to the price of WAFER (chip). % to 8% of the cost increase. For the current chip market with increasingly fierce price competition, capacitors made by MIM are definitely not the best way. Other processes provide MOM (metal-oxide-metal) capacitors, or require chip designers to design MOM capacitors themselves. However, the unit capacitance of a simple MOM capacitor is low. For circuit designs that require large capacitors, it is necessary to increase the area of ​​the MOM capacitor to increase the capacitance value...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02
CPCH01L28/87
Inventor 贾金辉徐跃江岳云奚谷枫
Owner 常州新超电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products