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System, method and apparatus for deep slot, thin kerf pixelation

A pixel and pixel width technology, applied in the field of imaging arrays, can solve problems such as increasing the risk of crystal fracture

Inactive Publication Date: 2014-06-04
SAINT GOBAIN CERAMICS & PLASTICS INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

As the depth of the cut increases, more of the blade comes into contact with the crystal, increasing the risk of crystal fracture

Method used

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  • System, method and apparatus for deep slot, thin kerf pixelation
  • System, method and apparatus for deep slot, thin kerf pixelation
  • System, method and apparatus for deep slot, thin kerf pixelation

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[0013] Scintillation detectors are generally used to detect relatively high-energy photons, electrons, or alpha particles, where the high energy is 1 KeV or higher, including gamma rays, alpha particles, and beta particles. It will be appreciated that these photons, electrons or alpha particles cannot be readily detected by conventional photodetectors which, for example, may be sensitive to photons having wavelengths of 200nm or longer (including 200nm to 800nm). Scintillators or scintillation crystals, ceramics or plastics absorb excited waves or particles and convert the energy of the waves or particles into pulses of light. Light can be converted into electrons (ie, electron current) using photodetectors, such as photodiodes, charge-coupled detectors (CCDs), or photomultiplier tubes.

[0014] The words "high energy surface" or "high energy end" as used herein refer to the surface of the scintillation array or the pixel into which high energy photons, electrons or alpha part...

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Abstract

An imaging array may comprise a plurality of imaging pixels that form an array, the array having a high energy end, a light exit end and an axis, and each of the pixels has a pixel width PW orthogonal to the axis; septa positioned in the array such that there is a septum between adjacent ones of the imaging pixels, and each of the septa has a depth D in an axial direction; and an aspect ratio of PW:D less than 0.2.

Description

technical field [0001] The present invention relates generally to imaging arrays, and in particular to systems, methods, and devices for imaging arrays using deep grooves, shallow cutouts, and pixelation. Background technique [0002] Scintillation detectors are typically used to detect high-energy emissions, such as high-energy photons, electrons, or alpha particles, that are not easily detected by conventional photodetectors. A scintillator, or scintillation crystal, absorbs high-energy emissions and converts the energy into pulses of light. Light can be converted into electrons (ie, a flow of electrons) using photodetectors, such as photodiodes, charge-coupled detectors (CCDs), or photomultiplier tubes. Scintillation detectors can be used in a variety of industries and in a variety of applications, including medicine (e.g. producing images of internal organs), geography (e.g. measuring the radioactivity of the Earth), inspection (e.g. non-destructive, non-invasive testin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/20A61B6/00
CPCG01T1/20A61B6/037A61B6/4258G01B11/14G01J1/4228G01J1/44G01T1/2006
Inventor T·A·塞尔夫
Owner SAINT GOBAIN CERAMICS & PLASTICS INC