A test method for zero-biased long-term and short-term change value applied to mems inertial group

Abstract

The invention discloses a zero offset short and long-term change value testing method applied to an MEMS (Micro-electromechanical Systems) inertia unit. The zero offset short and long-term change value testing method comprises the following steps: (1), obtaining an original output digital quantity of the MEMS inertia unit; (2), performing error compensation on the original output digital quantity; (3), obtaining an angular velocity and an acceleration which are output by the MEMS inertia unit in each beat; (4), with the angular velocity and the acceleration which are output by the MEMS inertia unit in each beat as one group of testing data samples X1, continuously recording multiple groups of Xi from a fixed moment, recording a duration as t; (5), if t is not more than 40 min, solving zero offset short-term change values delta XS of the MEMS inertia unit by using all Xi, if t is more than 40 min, solving zero offset long-term change values delta XL of the MEMS inertia unit; and (6), selecting a formula (described in the specification) as a judgment condition, if and only if the zero offset short-term change values of the MEMS inertia unit are all less than J, judging that the zero offset short-term change values of the MEMS inertia unit meet the requirement, and if and only if the zero offset long-term change values of the MEMS inertia unit are all less than J, judging that the zero offset long-term change values of the MEMS inertia unit meet the requirement.

Description

technical field [0001] The invention belongs to the field of automatic control and relates to a performance test method of MEMS inertial measurement combination. Background technique [0002] MEMS (Micro Electro Mechanical Systems) refers to a micro-device or system that can be mass-produced and integrates micro-mechanisms, micro-sensors, micro-actuators, signal processing and control circuits, until structure, communication and power supply are integrated. MEMS inertial group refers to the inertial measurement combination constructed with MEMS inertial devices (gyroscope, accelerometer). [0003] MEMS inertial groups have the characteristics of small size, impact resistance, high reliability, long life, and low cost, and have been widely used in my country's spacecraft. In order to successfully apply MEMS inertial groups to aerospace products, it is necessary to solve practical application problems in engineering, and study a set of methods for evaluating its performance i...

AI Technical Summary

Problems solved by technology

[0005] The technical problem solved by the present invention is: aiming at the characteristics of poor stability of MEMS inertial group bias and low device precision, a method for separately testing the short-term change value and long-term change value of MEMS inertial group bias is provided, And select the appropriate criterion according to the accuracy of the single meter, so as to achieve the purpose of testing the performance of the MEMS inertial group in the system

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