Ionization spectral-line analyzer for sample atoms

An atomic ionization and analyzer technology, applied in the field of atomic ionization spectrum analysis, which can solve the problems of obvious matrix effect, poor precision, chemical interference, etc.

Inactive Publication Date: 2014-09-03
成都中远千叶科技有限公司
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  • Application Information

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Problems solved by technology

However, the existing atomic ionization line analysis often has problems such as poor precision, obvious matrix effect, and serious chemical interference. Therefore, it is necessary to improve the existing technology to improve the analytical sensitivity and reduce the detection limit.

Method used

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  • Ionization spectral-line analyzer for sample atoms

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Embodiment Construction

[0024] Firstly, the generation of the far-band spectrum and the control of the beam energy spectrum range are carried out through the far-wave band beam device (1) to realize the dynamic and precise adjustment of the band range, and the spectrum isolation device (2) is used to realize the screening of the beam band and the adjustment of the range of the beam spectral line , according to different analysis requirements and precision to achieve band selection isolation and filtering, with the help of the near-band beam device (3) for near-band spectrum control and beam intensity constraints, according to the requirements of the analysis spectrum to provide spectral types that meet the requirements, combined with beam gathering reflection The device (4) carries out the adjustment and constraint control of beam aggregation and conduction path, and uses the beam band thermal analysis device (5) to generate the beam high-temperature dissociation band spectral lines, so as to realize t...

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Abstract

An ionization spectral-line analyzer for sample atoms is characterized by mainly comprising a far-wave-band light beam apparatus, a spectrum isolation apparatus, a near-wave-band light beam apparatus, a light-beam convergence reflection apparatus, a light-beam wave-band thermal analysis apparatus, a sampling apparatus, a signal conversion apparatus, a signal amplification apparatus, a signal harmonic-wave apparatus and a signal display recording apparatus; the far-wave-band light beam apparatus comprises a wide-frequency-band spectrum emission electrode, and the electrode material is curium neptunium oxide octachromate alloy; the spectrum isolation apparatus comprises a heptagonal-prism type light-beam separating lens, and the lens surface is covered with three layers of a promethium flerovium oxide pentabromate nanometer composite filtering membrane; the near-wave-band light beam apparatus compriess a narrow-wave-band energy spectrum emission electrode, and the electrode material is fermium ruthenium pentaoxide hexacobaltate; and the light-beam convergence reflection apparatus comprises a hendecagonal-prism polarizing harmonic-wave lens, a concavo-concave focusing lens and an eight-slit diffraction light-passing plate, and the surface of the hendecagonal-prism polarizing harmonic-wave lens is plated with a rhenium germanium octafluoride penta-antimonate filtering membrane.

Description

technical field [0001] The invention relates to the field of atomic ionization line analysis, in particular to a sample atomic ionization line analyzer. Background technique [0002] Atomic ionization line analysis, mainly through the atoms or molecules at a high energy level to generate radiation when they transition to a lower energy level, and emit excess energy to form a spectrum. The atoms or molecules are excited at a higher energy level. The excited ones are in Atoms and molecules at higher energy levels transition to lower energy levels and emit photons. In the study of atomic spectroscopy, emission spectroscopy is often used. When atoms are excited by external factors, electrons absorb a certain amount of energy and jump into other possible orbits with higher energy. Spontaneous Jumping to a possible orbit of a lower energy level and emitting a photon, the spectral line emitted when jumping from a different possible orbit with a higher energy to the same possible or...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63
Inventor 彭飞储冬红
Owner 成都中远千叶科技有限公司
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