Spectral emissivity steady testing system and method

A technology of spectral emissivity and testing system, which is applied in the field of steady-state testing system of spectral emissivity, can solve problems such as the limitations of the assumption model of sample spectral emissivity, and achieves overcoming limitations, improving steady-state testing accuracy, and overcoming dependence. sexual effect

Active Publication Date: 2014-09-17
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] The technical problem to be solved by the present invention is the dependence of the existing steady-state test method and system on the accurate measurement of the temperature of the high-temperature sample, and the limitations of the hypothetical model of the spectral emissivity of the sample

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  • Spectral emissivity steady testing system and method
  • Spectral emissivity steady testing system and method

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Embodiment 1

[0038] The embodiment of the present invention discloses a steady-state test system of spectral emissivity, such as figure 1 as shown, figure 1 The meanings of the marks in are: sample 1, hemispherical airtight cavity 2, window 3, heater 4, vacuum pump 5, mirror 6, spectral radiation energy measurement unit 7, the system includes:

[0039] a sample heating unit for thermally radiating heating of a sample 1, which is an opaque material with a diffuse surface;

[0040] The spectral radiant energy measuring unit 7 is used to measure the multi-spectral effective radiant energy on the surface of the sample 1; in this embodiment, the spectral radiant energy measuring unit 7 can be selected from existing spectroradiometers, spectrometers, etc. on the market;

[0041] The spectral emissivity inversion unit is configured to invert the spectral emissivity and temperature of the sample 1 according to the multi-spectral effective radiant energy.

[0042] Wherein, the sample heating unit...

Embodiment 2

[0064] The embodiment of the present invention discloses a steady-state test method of spectral emissivity, the method comprising:

[0065] S1. The reference sample is placed on the sample holder in the sample heating unit, the reference sample is heated by thermal radiation through the thermal radiation source in the sample heating unit, and the reference sample is cooled by the cooling circuit installed on the sample holder, so The diffuse reflectance of the surface of the reference sample is a preset value, and the preset value is greater than 0.9;

[0066] In this embodiment, the effect of cooling the reference sample through the cooling circuit installed on the sample holder is to keep the reference sample in a cool state under the condition of being heated by a thermal radiation source;

[0067] S2. Measure the multi-spectral effective radiant energy of the surface of the reference sample by the spectral radiant energy measurement unit to obtain the reflected multi-spect...

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Abstract

The invention discloses a spectral emissivity steady testing system and a spectral emissivity steady testing method. The system comprises a sample heating unit used for carrying out thermal radiation heating on a sample which is an opaque material with a diffusion surface, a spectral radiation energy measuring unit used for measuring multispectral effective radiation energy on the surface of the sample, and a spectral emissivity inversion unit used for inverting the spectral emissivity and temperature of the sample according to the multispectral effective radiation energy. Compared with a spectral emissivity direct measuring method, the method provided by the invention does not need to take a blackbody origin for reference, and overcomes the dependence on accurate measurement of the temperature of a high-temperature sample; compared with a spectral emissivity measuring method based on an emissivity model, the method provided by the invention is not dependent on the spectral emissivity for building the model, so as to overcome the problem of limitation on application caused by an emissivity assumption model.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a steady-state test system and method for spectral emissivity. Background technique [0002] Spectral emissivity is one of the important thermophysical parameters of materials, which characterizes the spectral radiation ability of the material surface, and is an important basic physical property data for optical measurement, radiation heat transfer and thermal efficiency analysis. It is of great significance and widely used in power, aerospace and other fields. [0003] The existing steady-state test methods of spectral emissivity include direct measurement method based on spectral emissivity definition and multi-spectral steady-state test method based on specific emissivity model. [0004] The direct measurement method based on the definition of spectral emissivity calculates the spectral emissivity at a specific temperature by comparing the spectral radiation intensity of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/47
Inventor 符泰然段明皓唐佳琦
Owner TSINGHUA UNIV
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