An X-ray Defect Detection Control System

Abstract

The invention discloses an X-ray defect detection control system, which includes an X-ray sensor signal acquisition module, and the X-ray sensor signal acquisition module is sequentially connected to a CPLD module through signal filtering, signal amplification, and an AD converter, and the CPLD module is interactively connected to an SOC module ; The SOC module is respectively connected with the digital signal acquisition and storage module, the transmission mechanism of the detected object, the image detection and recognition mechanism, and the elimination alarm mechanism; the SOC module is also connected with the PC for human-computer interaction. The device of the present invention can perform reliable communication with various peripheral devices, realize reliable collection of data, real-time storage of data, real-time processing of high-resolution images, and real-time feedback of processing results, and is widely used in the field of industrial quality control, social And the market value is huge.

Description

technical field [0001] The invention belongs to the technical field of industrial quality control, and relates to an X-ray defect detection and control system. Background technique [0002] In recent years, product quality problems have been increasing, which not only seriously affects the interests of users, but also seriously affects the reputation of businesses. With the integration of the global economy, the trade between countries in the world is increasing day by day, and the product quality problems in a certain area may affect the whole world. Therefore, we must pay attention to and take corresponding technical measures to improve product quality and reduce enterprise risks. Moreover, The link of product testing is essential. However, the key testing instruments and equipment testing technology of many enterprises are backward, and the performance can no longer meet the testing requirements of modern products. [0003] Most of the products themselves are opaque, an...

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Problems solved by technology

[0007] The purpose of the present invention is to provide an X-ray defect detection control system, which solves the difficulty in realizing the integration of high-speed SOC modules and CPLD modules in the prior art, so that the operation of the entire system is more rapid and flexible, and the operating parameters and detection parameters can be changed. Materials, testing for different products

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