Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for testing compatibility adaptability of host and storage device

A storage device and test method technology, applied in the field of testing, can solve problems such as narrow adaptation, evaluation, and difficult hardware systems, and achieve the effect of ensuring operational stability, stable and reliable functional testing and performance testing

Inactive Publication Date: 2014-11-05
INSPUR BEIJING ELECTRONICS INFORMATION IND
View PDF4 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there are many host and storage device manufacturers with complex models and specifications, and the differences in architecture and operation methods are relatively large. However, the current compatibility and adaptation tests are often only for specific brands and models, and it is difficult to form standard procedures and test specifications. In this way, Not only is the scope of adaptation narrow, but it is also difficult to properly and comprehensively evaluate the hardware system formed by the interconnection of storage and hosts. If the test is not sufficient, there may be compatibility risks in the process of using the device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for testing compatibility adaptability of host and storage device
  • Method and system for testing compatibility adaptability of host and storage device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be described in detail below in conjunction with specific embodiments shown in the accompanying drawings.

[0019] figure 1 It is a schematic flow chart of the host and storage device compatibility and adaptation testing method of the present invention, such as figure 1 shown, including:

[0020] In step 11, a basic implementation test of compatibility and adaptation is performed between the host and the storage device, and the basic implementation test includes a board driver identification test for connecting the storage device.

[0021] In this step, the board driver identification test of the connected storage device may include a host bus adapter (HBA, Host Bus Adapter) card, a serial attached SCSI (SAS, Serial Attached SCSI) card identification test, a storage area network (SAN, Storage Area Network), SAS parameter test and storage device file test.

[0022] Among them, taking HBA card, SAS card and other board card driver identificat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method and system for testing compatibility adaptability of a host and a storage device. The method includes the steps that a foundation implementing test for compatibility adaptability is conducted between the host and the storage device and comprises an identification test of a board card driver connected with the storage device; function tests for compatibility adaptability are conducted between the host and the storage device and comprise a host identification storage device data volume test and a file operation test on a disk of the storage device; performance tests for compatibility adaptability are conducted between the host and the storage device and comprise a storage device disk load test, a storage device disk pressure test, a storage device disk concurrency test and a storage device disk stability test. According to the method and system, the compatibility adaptability tests between the host and the storage device are universalized, standardized and normalized.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a host computer and a storage device compatibility test method and system. Background technique [0002] With the popularization and use of storage products, the compatibility and adaptation between host and storage, and the stability, reliability and system performance of the basic hardware environment after storage and host connection are more and more valued by users. [0003] Compatibility and adaptation testing refers to testing whether the software can run friendly on a specific hardware platform, between different application software, on different operating system platforms, and in different network environments. At present, there are many host and storage device manufacturers with complex models and specifications, and the differences in architecture and operation methods are relatively large. However, the current compatibility and adaptation tests are often only for spe...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/26
Inventor 李勋堂
Owner INSPUR BEIJING ELECTRONICS INFORMATION IND
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products