Method for determining three-dimensional direction of single crystal

Abstract

The invention discloses a method for determining a three-dimensional direction of a single crystal. The method comprises determination of a one-dimensional direction of the single crystal and determination of the three-dimensional direction of the single crystal. The method comprises the following steps: (1) determining the one-dimensional direction of the single crystal by an XRD sample platform provided by the utility model with a patent number being 200620079376.7; and (2) marking a two-dimensional coordinate system on a predetermined crystallography plane (h1k111) after the one-dimensional direction of the crystal is determined so as to determine the three-dimensional direction of the single crystal, namely, firstly determining an X axis of the two-dimensional coordinate system in the crystallography plane (h1k111), marking a straight line, which is a Y axis, perpendicular to the X axis in the crystallography plane (h1k111) according to a right-hand rule, and taking a normal direction [h1k111]of the crystallography plane (h1k111) as a Z axis of a three-dimensional coordinate system to determine the three-dimensional direction of the single crystal. Through the method for determining the three-dimensional direction of the single crystal, the three-dimensional direction of the crystal can be quickly determined by only carrying out a diffraction experiment on one crystal plane of the crystal, and thus the blindness and the waste of the crystal in the direction determining process are avoided.

Description

【Technical Field】 [0001] The invention belongs to the technical field of single crystal materials, and specifically relates to a method for determining the three-dimensional direction of a single crystal. 【Background technique】 [0002] Single crystal materials have important applications in many fields such as optics, electronic components, and piezoelectric devices. In order to maximize the performance characteristics of single crystal materials, it is necessary to determine the crystal orientation of the crystal before use. Crystal orientation methods mainly include: X-ray diffractometer method, Lloyd's method, electron backscattering and other methods. Among them, the X-ray diffractometer method is currently the most widely used method. However, the biggest disadvantage of this method is that during the orientation process, the crystal needs to be continuously rotated in the three-dimensional space. This process has a certain degree of blindness, so it usually takes a long ...

AI Technical Summary

Problems solved by technology

However, the biggest disadvantage of this method is: during the orientation process, the crystal needs to be continuously rotated in three-dimensional space, and there is a certain blindness in this process, so it usually takes a long time

However, for crystals that need to be oriented in three dimensions, this shortcoming is highlighted, which greatly reduces the efficiency of crystal orientation

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