Method for determining three-dimensional direction of single crystal

A single crystal, three-dimensional technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of reducing crystal orientation efficiency and taking a long time

Inactive Publication Date: 2014-11-19
SHAANXI DAYI TECH
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Problems solved by technology

However, the biggest disadvantage of this method is: during the orientation process, the crystal needs to be continuously rotated in three-dimensional space, and there is a certain blindness in this

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  • Method for determining three-dimensional direction of single crystal
  • Method for determining three-dimensional direction of single crystal
  • Method for determining three-dimensional direction of single crystal

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Embodiment Construction

[0029] The present invention will be further described in detail below in conjunction with the drawings.

[0030] See figure 1 with figure 2 , A method for determining the three-dimensional direction of a single crystal of the present invention includes determining the one-dimensional direction of the single crystal and the three-dimensional direction of the single crystal; wherein,

[0031] 1) Using the XRD sample stage device provided by the utility model patent No. 200620079376.7 to determine the one-dimensional direction of the single crystal, the specific steps are as follows:

[0032] The first step is to determine the spatial angle between the surface of the crystal sample and the crystallographic plane you are looking for Install the crystal sample stage on the XRD diffractometer, glue the crystal sample to the end face of the shaft sleeve in the sample stage device, and keep the crystal sample surface parallel to the upper plane of the shaft. After the crystal sample is ins...

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Abstract

The invention discloses a method for determining a three-dimensional direction of a single crystal. The method comprises determination of a one-dimensional direction of the single crystal and determination of the three-dimensional direction of the single crystal. The method comprises the following steps: (1) determining the one-dimensional direction of the single crystal by an XRD sample platform provided by the utility model with a patent number being 200620079376.7; and (2) marking a two-dimensional coordinate system on a predetermined crystallography plane (h1k111) after the one-dimensional direction of the crystal is determined so as to determine the three-dimensional direction of the single crystal, namely, firstly determining an X axis of the two-dimensional coordinate system in the crystallography plane (h1k111), marking a straight line, which is a Y axis, perpendicular to the X axis in the crystallography plane (h1k111) according to a right-hand rule, and taking a normal direction [h1k111]of the crystallography plane (h1k111) as a Z axis of a three-dimensional coordinate system to determine the three-dimensional direction of the single crystal. Through the method for determining the three-dimensional direction of the single crystal, the three-dimensional direction of the crystal can be quickly determined by only carrying out a diffraction experiment on one crystal plane of the crystal, and thus the blindness and the waste of the crystal in the direction determining process are avoided.

Description

【Technical Field】 [0001] The invention belongs to the technical field of single crystal materials, and specifically relates to a method for determining the three-dimensional direction of a single crystal. 【Background technique】 [0002] Single crystal materials have important applications in many fields such as optics, electronic components, and piezoelectric devices. In order to maximize the performance characteristics of single crystal materials, it is necessary to determine the crystal orientation of the crystal before use. Crystal orientation methods mainly include: X-ray diffractometer method, Lloyd's method, electron backscattering and other methods. Among them, the X-ray diffractometer method is currently the most widely used method. However, the biggest disadvantage of this method is that during the orientation process, the crystal needs to be continuously rotated in the three-dimensional space. This process has a certain degree of blindness, so it usually takes a long ...

Claims

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Application Information

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IPC IPC(8): G01N23/207
Inventor 郭振琪李飞郭爱
Owner SHAANXI DAYI TECH
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