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Markov process based IED (intelligent electronic device) formal-description performance analysis method

A technology of formal description and analysis method, applied in the field of IED formal description performance analysis based on Markov process, can solve the problem of weak support for non-functional requirements, and achieve the effect of simple and practical method, wide application range and perfect method

Active Publication Date: 2014-11-19
湖北恒维通智能科技有限公司
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Problems solved by technology

Although the CSP description provides good support for the design of system functions, it does not support the non-functional requirements of the system (such as reliability)

Method used

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  • Markov process based IED (intelligent electronic device) formal-description performance analysis method
  • Markov process based IED (intelligent electronic device) formal-description performance analysis method
  • Markov process based IED (intelligent electronic device) formal-description performance analysis method

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Embodiment Construction

[0043] The technical solutions of the present invention are further described below with reference to the accompanying drawings and specific embodiments.

[0044] According to the IEC61850 standard, the simplified interaction model of timed overcurrent protection is as follows figure 1 shown.

[0045] Regardless of the time characteristics of the message, the simplified CSP description of the interaction behavior of four logical nodes is as follows:

[0046] PTOC=goose_off→tr→PTOC∏goose_off_on→tr→PTOC

[0047] RREC=goose_off→op→RREC∏goose_on→op→RREC

[0048] ∏goose_off_on→op→RREC

[0049] XCBR=goose_off→goose_off_on→stval→XCBR

[0050] ∏goose_on→goose_off_on→stval→XCBR

[0051] IHMI=tr→IHMI∏op→IHMI∏stval→IHMI

[0052] in accordance with figure 2 The transformation rules of the four processes correspond to the Petri net model such as Figure 3-Figure 6 .

[0053] After these four processes are combined in parallel, we can get Figure 7 A Petri net model that simplifi...

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Abstract

The invention discloses a Markov process based IED (intelligent electronic device) formal-description performance analysis method. The Markov process based IED (intelligent electronic device) formal-description performance analysis method includes steps of constituting one random Petri net by each transitional time-delay compliance exponent distribution function after converting CSP (communicating sequential processes) descriptions into a Petri net and analyzing performance of a system described by CSP by the Petri net. The Markov process based IED formal-description performance analysis method further includes steps of (1) structuring Markov chain isomorphic with the random Petri net; (2) calculating a performance parameter change law of the system described by the CSP on the basis of steady-state probability of the Markov chain so as to provide a reference for formal design of the IED.

Description

technical field [0001] The invention belongs to the technical field of substation IED (Intelligent Electronic Device, intelligent electronic device) design, and relates to a Markov process-based IED formal description performance analysis method. Background technique [0002] The IEC61850 standard is the only international standard for the substation automation system based on the general network communication platform. The fifth part defines the IED in the substation automation system as one or more processors, and has the ability to receive external resources and (or) to A device that sends data and / or control commands from an external resource. Such as electronic multi-function instruments, digital relays, controllers, etc. An IED is an entity that can complete the tasks of one or more specific logical nodes within a certain range and under the condition of limited interface. [0003] With the development of digital substations, substation automation based on IEC61850 s...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 张其林王先培赵永标袁磊
Owner 湖北恒维通智能科技有限公司
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