Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Line structured optical three-dimensional measurement system and three-dimensional texture image construction algorithm

A three-dimensional measurement and line structured light technology, which is applied in measurement devices, 3D modeling, image data processing, etc., can solve problems such as limiting the scope of application, and achieve the effect of improving stability and operability, and improving test accuracy.

Inactive Publication Date: 2014-12-24
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF5 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this technology can only map part of the texture of objects with distinctive feature points, and has strict angle requirements for the provided images, which limits its scope of application

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Line structured optical three-dimensional measurement system and three-dimensional texture image construction algorithm
  • Line structured optical three-dimensional measurement system and three-dimensional texture image construction algorithm
  • Line structured optical three-dimensional measurement system and three-dimensional texture image construction algorithm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The present invention will be further elaborated below in conjunction with the accompanying drawings.

[0027] like figure 1 As shown, a three-dimensional line-structured light measurement system includes two CCD cameras and their two-dimensional shifting fixed brackets, three coplanar line lasers and their two-dimensional adjustment platforms; the three line-structured lasers are distributed at an angle of 120° , each of which is equidistant from the center line of the object to be measured, so as to ensure that the laser band projected on the surface of the object to be measured changes uniformly, and the two-dimensional platform is adjusted to make the laser surfaces coplanar, so that a circular cross-sectional profile of the laser light is formed on the surface of the object to be measured Then use the camera to acquire the light belt image, and send the acquired image to the computer to calculate the outline information of the measured object. Two CCD cameras resp...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a line structured optical three-dimensional measurement system and a three-dimensional texture image construction algorithm. The system comprises a CCD camera, a two-dimensional shifting fixed support, a linear laser device and a two-dimensional adjusting platform. The CCD camera is fixed to one end of the two-dimensional shifting fixed support; the linear laser device is fixed to the other end of the two-dimensional shifting fixed support; the two-dimensional adjusting platform is arranged on the two-dimensional shifting fixed support and is used for containing a measured object. According to the three-dimensional texture image construction algorithm based on the system, a new color texture mapping method is adopted to construct a distortionless three-dimensional outline curved surface formed by real image outlines. According to the core concept, binarized contour lines without any color are made to have color information (or grey information) through color texture mapping. According to the line structured optical three-dimensional measurement system and the three-dimensional texture image construction algorithm, a three-dimensional texture model with the real surface textures can be constructed.

Description

technical field [0001] The invention belongs to the field of three-dimensional measurement of objects, and in particular relates to a three-dimensional measurement system of line structured light and a 3D texture image construction algorithm based on the system. Background technique [0002] With the rapid development of machine vision, 3D measurement and computer graphics, 3D measurement of objects has become a research hotspot because of its wide application value. The optical three-dimensional measurement technology based on laser scanning can easily obtain and display the real geometric contour structure of the object surface, but the displayed three-dimensional image is generally a mesh and point structure, which can only reflect the geometric contour of the object and cannot reflect the real texture of the object surface Variety. In many applications, it is hoped that the displayed 3D image can not only reflect the geometric structure of the object, but also reflect t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G06T17/00
Inventor 余学才江倩王宁宁蒋波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com