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Material outgassing effect analysis test system on optical transmittance

A test system and transmittance technology, applied in the field of analytical test systems, can solve the problems of large measurement error, inability to analyze the influence of optical transmittance of micro-level pollutants, and inability to monitor the level of pollutants deposited on the surface in real time.

Inactive Publication Date: 2016-09-14
BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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Problems solved by technology

[0004] At present, the analysis test of the influence of material degassing on optical transmittance is usually carried out in a vacuum environment, heating and degassing the material, and at the same time using an optical test piece to sample pollutants, and using an electronic balance to weigh the optical test piece before and after the test. Heavy, to obtain the magnitude of the sampled pollutants; this method cannot monitor the magnitude of the surface deposited pollutants in real time, and can only estimate the magnitude of the pollutants through the experience of multiple tests; and it cannot analyze the optical transmittance of small-scale pollutants Influence; and the pollution test method adopted may be affected by human and environmental factors, resulting in large measurement errors

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  • Material outgassing effect analysis test system on optical transmittance

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[0017] The test system for analyzing the influence of material outgassing on optical transmittance of the present invention comprises a vacuum environment unit, a material outgassing unit, a pollution deposition amount testing unit, and an optical transmittance sampling and analyzing unit. figure 1 The test system for analyzing the influence of material outgassing on optical transmittance is shown. The analysis and test unit includes the following structure. The material degassing box 12 is placed in the vacuum tank 11, and the material degassing box 12 is wrapped with a heating unit 13. The heating unit 13 can be a heating sheet or a heating resistor. The temperature measurement unit 14 is placed in the material outgassing box 12, and may be a thermocouple or a platinum resistor. The air release port of the material air release box 12 faces the direction of the temperature control platform 18 . The heating unit 13 and the temperature measuring unit 14 are connected to the co...

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Abstract

The invention discloses an analysis testing system for analyzing influence of material deflation component deposition pollutants on optical transmittance. The analysis testing system comprises a vacuum environment unit, a material deflation unit, a pollution deposition testing unit and an optical transmittance sampling analysis unit. The analysis testing system disclosed by the invention can rapidly establish a space vacuum environment and develops testing analysis on influence of the pollutants with different deflation temperature environments, different deposition temperature environments and different pollutant magnitudes on the optical surface transmittance for various non-metallic materials.

Description

technical field [0001] The patent of the present invention mainly relates to an analysis test system for the influence of pollutants deposited by outgassing components on optical transmittance, which can accurately and quickly analyze the influence of different levels of pollutants on optical transmittance. Background technique [0002] During the operation of the spacecraft in orbit, the vacuum environment and the hot and cold environment will cause various non-metallic materials used on the spacecraft to outgas, and the organic molecular pollutants released will be deposited on the surface of the spacecraft with a lower temperature. Contaminant deposition will affect the optical performance of sensitive components of the spacecraft, such as affecting the transmittance performance of optical surfaces. [0003] The influence of outgassing pollutants from non-metallic materials of spacecraft on optical transmittance is analyzed. It is necessary to establish a space vacuum en...

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Application Information

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IPC IPC(8): G01N21/25
Inventor 于钱臧卫国杨东升院小雪田东波姜海富周晶晶
Owner BEIJING INST OF SPACECRAFT ENVIRONMENT ENG