Method and system for detecting resolution of intelligent terminal hard-contact binary input

A smart terminal and binary input technology, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve the problems of no unified conclusion in standards, and different resolution and accuracy of hard contact binary inputs.

Active Publication Date: 2017-11-10
STATE GRID CORP OF CHINA +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the existing technology, because the smart terminal technology, hardware selection, software development and other links mastered by each device manufacturer are different, there is no unified conclusion on whether to meet the standards of the State Grid Corporation for smart terminals
In addition, the technical methods adopted by each manufacturer are different, and the resolution accuracy of the final hard contact digital input will be different.

Method used

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  • Method and system for detecting resolution of intelligent terminal hard-contact binary input
  • Method and system for detecting resolution of intelligent terminal hard-contact binary input
  • Method and system for detecting resolution of intelligent terminal hard-contact binary input

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Experimental program
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Effect test

Embodiment 1

[0089] Considering that the standard requires that the resolution should be less than 1ms, and the processing capabilities of the CPUs selected by each manufacturer for hard-contact binary inputs, in order to accurately examine the processing accuracy of the CPU resolution of each manufacturer, and to avoid errors caused by the 1ms full-second interval , in the following detection scheme, it is designed to be 3 experiments, the sending interval of 3 voltage signals in the first experiment is 0.8ms, the sending interval of the second experiment is 1.2ms, and the sending interval of the third experiment is 5ms.

[0090] The reason why three test intervals of 0.8ms, 1.2ms and 5ms are used here is because the resolution of the smart terminal to be tested is 1ms, but considering that the signal sent by the relay protection tester may have a slight time error, all increases 1.2 times the reliability factor. That is to say, even if the relay protection tester has a slight error, the ...

Embodiment 2

[0092] In this embodiment, only three interrupts can be used to process the test with a sending interval of 1.2 ms. If the 1.2 ms test can pass, the tested smart terminal meets the requirements.

Embodiment 3

[0094] Such as Figure 10 As shown, it is an actual test situation, in which the interrupt processing interval of intelligent terminal 1 is 0.6ms, the interrupt processing interval of intelligent terminal 2 is 1.6ms, and the interval of the four voltage signals sent by the relay protection tester is 1.2ms , then if Figure 10 As shown, the resolution of the two smart terminals is tested by the relay protection tester. The relay protection tester sends out a voltage signal for testing every 1.2ms. For the intelligent terminal with an interrupt processing interval of 0.6ms, it can clearly distinguish the voltage signals of all testers, so the intelligent terminal is qualified; For a smart terminal of 1.6 ms, signal 1 and signal 2 will be mistaken for simultaneous voltage signals, and their order cannot be determined, so the smart terminal is unqualified.

[0095] The sampling principle of the smart terminal is: the smart terminal can receive the voltage signal from the relay p...

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Abstract

The embodiment of the present invention provides a method and system for detecting the resolution of the binary input quantity of the hard contact of the intelligent terminal. The system includes a relay protection tester, a tested intelligent terminal and a detection device, wherein the relay The protection tester is connected with the intelligent terminal under test through a cable; the intelligent terminal under test is connected with the detection device through industrial Ethernet; the relay protection tester includes a plurality of openings , the opening port is used to output a voltage signal to the smart terminal under test according to a preset time; the smart terminal includes a plurality of opening ports, and the opening port is used to receive the opening port The voltage signal output by the outlet records the time when the voltage signal is received, and generates message information according to the time. It achieves the purpose of comprehensive, detailed and in-depth detection of the tested smart terminal equipment, and plays an important role in mastering the performance of smart terminals from various manufacturers.

Description

technical field [0001] The present invention relates to the technical field of smart substations in power systems, in particular to the technical field of detection of smart terminals in smart substations, and specifically to a method and system for detecting the resolution of hard-contact binary inputs of smart terminals. Background technique [0002] At present, the domestic smart grid is in a period of rapid development. As an important part of the smart grid, smart substations are getting more and more attention. The smart substation not only has a significant change in the primary equipment link, but replaces the conventional transformer with an electronic transformer, replaces the conventional circuit breaker with a smart circuit breaker, and greatly optimizes the secondary system, replacing the cable with an optical cable. Reduce the complexity of the secondary circuit, effectively control the cost, and greatly reduce the secondary electromagnetic interference and cir...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 孟超刘蔚高旭王丰刘苗刘平马锁明王沛然辛光明黄天啸张硕张思琪吴涛姜昌盛
Owner STATE GRID CORP OF CHINA
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