Integrated Circuit Test System Load Board Calibration System

Abstract

The invention provides a loading board calibration system for an integrated circuit testing system, which includes a high-speed signal input module, an integrated circuit interface adapter module, a probe positioning module and a calibration module; the output end of the high-speed signal input module is connected to the input of the loading board to be calibrated The terminals are electrically connected; the input terminal of the integrated circuit interface adapter module is electrically connected with the output terminal of the loading board to be calibrated; the output terminal of the integrated circuit interface adapter module is electrically connected with the input terminal of the probe positioning module; the The output end of the probe positioning module is electrically connected to the input end of the calibration module; the output end of the calibration module is electrically connected to the input end of the high-speed signal input module; through quantitative analysis of the main performance indicators of the loading board, the problem is solved. The limitations of the traditional qualitative test analysis of the loading board and other deficiencies ensure the accuracy and reliability of the measured values ​​of the high-speed and large-scale integrated circuit parameters.

Description

technical field [0001] The invention relates to the technical field of measurement of integrated circuit test fixtures, in particular to a loading board calibration system for an integrated circuit test system. Background technique [0002] The integrated circuit test system loading board (hereinafter referred to as the loading board) is the connection circuit between the pogo pins of the test channel port of the integrated circuit test system and the pins of the integrated circuit under test. It is usually based on an insulating board and cut to a certain size. There are designed conductive patterns to realize the interconnection between the input / output ports of the integrated circuit and the input / output pins of the tested integrated circuit. As the data rate requirements of integrated circuits are getting higher and higher, the test rate capability that the integrated circuit test system can provide is also getting higher and higher, and the requirements for the transmis...

AI Technical Summary

Problems solved by technology

At present, the most common test method for loading boards is to judge qualitatively through eye diagram changes. The judgment basis is also based on the user's understanding and acceptance of high-speed signal transmission performance. There is no unified specification and standard that can be relied upon.

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