Infrared focal plane array chip startup and shutdown cycle life testing method and device

Abstract

The invention discloses an infrared focal plane array chip startup and shutdown cycle life testing method and device. The method comprises the following steps of selecting a plurality of infrared focal plane array chips as samples, and conducting statistics on initial blind pixel rates of the samples; conducting startup and shutdown cycle life tests with preset number of times, and conducting statistics on final blind pixel rates on samples after the tests are finished; according to the initial blind pixel rates and the final blind pixel rates, by means of unilateral estimation, calculating an upper limit of the blind pixel rates of the infrared focal plane array chips under the preset confidence level; according to the upper limit of the blind pixel rates and the failure criteria of the blind pixel rates corresponding to the infrared focal plane array chips, determining the startup and shutdown cycle life of the infrared focal plane array chips. According to the infrared focal plane array chip startup and shutdown cycle life testing method and device, the number of the needed samples is small, the test cycle is short, the engineering construction cost is low, the method has scientificity and reasonability, and the purpose of evaluation of the IRFPA chip startup and shutdown cycle life is achieved.

Description

【Technical field】 [0001] The invention relates to the technical field of infrared detectors, in particular to a test method and device for the cycle life of an infrared focal plane array chip switching machine. 【Background technique】 [0002] Infrared focal plane array (IRFPA) chips are the core components of high-performance infrared systems, and play an important role in aerospace, aviation, industry and other fields. At present, it is developing in the direction of focal plane ultra-high-density integrated detector elements, high performance, high reliability, further miniaturization, and non-cooling, and is moving from the second-generation array technology to the third-generation miniaturized high-density and high-performance Infrared focal plane array technology development direction. [0003] In different mission application fields, the infrared focal plane array detector system needs to be turned on and off at different frequencies. Detector materials such as mercu...

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Problems solved by technology

However, this method has a large demand for test samples, but because the IRFPA chip is expens

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