Substrate checking device and method

Abstract

The invention relates to the technical field of display, in particular to a substrate checking device and method. The substrate checking device comprises a conveying table, a zone scanning camera, a line scanning camera and light sources, wherein the conveying table is used for bearing a substrate on the surface of the conveying table; the zone scanning camera is located on the first side of the conveying table, is opposite to the surface and is used for checking standard specifications of the substrate; the line scanning camera is located on the first side of the conveying table, is opposite to the surface and is used for checking edge lines and sizes of the substrate; and the light sources are located on the second side, opposite to the first side, of the conveying table and used for irradiating light to the substrate, and the light is supplied to the zone scanning camera and the line scanning camera for substrate checking. By means of the substrate checking device and method provided by the embodiment of the invention, specifications of substrates with varied forms can be checked, particularly, the substrate with a special-shaped character is checked, so that a poor substrate can be accurately judged.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a substrate inspection device and method. Background technique [0002] As we all know, display devices generally need to use substrates, for example, LCD display devices generally use array substrates, color filter substrates, and the like. Therefore, the selection of the substrate is very important for the display device. If the substrate is a defective product, the display device is likely to fail during use. For this reason, substrates usually need to be strictly inspected before leaving the factory, and in the prior art, the equipment used for inspecting substrates generally can only inspect substrates with standard regular quadrangular shapes, but cannot inspect substrates with irregular shapes other than regular quadrangular shapes. Effective inspection, resulting in greatly reduced pass rate of special-shaped substrates. Contents of the invention [0003] (1) Technic...

AI Technical Summary

Problems solved by technology

Therefore, the selection of the substrate is very important to the display device. If the substrate is a defective product, the display device is likely to fail during use.

For this reason, substrates usually need to be strictly inspected before leaving the factory, and in the prior art, the equipment used for inspecting substrates generally can only inspect substrates with standard regular quadrangular shapes, but cannot inspect substrates with irregular shapes other than regular quadrangular shapes. Effective inspection, resulting in greatly reduced qualification rate of special-shaped substrates

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