Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ultra-wideband target electromagnetic scattering characteristic test system and method

A target electromagnetic scattering and characteristic testing technology, which is applied in the field of materials, can solve the problems that the radiation characteristics of ultra-broadband feed sources are difficult to meet the target irradiation, and ultra-broadband testing cannot be performed.

Active Publication Date: 2015-04-15
BEIJING INST OF ENVIRONMENTAL FEATURES
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the radiation characteristics of the ultra-wideband feed source obtained by the existing ultra-wideband target characteristic testing system and method cannot meet the requirements of in-band target illumination and background control, so it cannot be directly used for ultra-wideband testing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ultra-wideband target electromagnetic scattering characteristic test system and method
  • Ultra-wideband target electromagnetic scattering characteristic test system and method
  • Ultra-wideband target electromagnetic scattering characteristic test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, the following will describe in detail with reference to the accompanying drawings and specific examples.

[0036] The radiation characteristics of the current ultra-wideband feeds are difficult to meet the requirements of in-band target illumination and background control, so they cannot be directly used for ultra-wideband testing. The embodiment of the present invention aims at the problems existing in the current ultra-wideband target characteristic test, and builds an ultra-wideband target scattering characteristic measurement system. The feed source used can be automatically switched to ensure that the phase difference remains unchanged, which overcomes the problem of the wide-band feed source. Existing shortcomings. The above-mentioned system is used to carry out target ultra-broadband scattering multi-band sweep measurement, and research the d...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Rotation angleaaaaaaaaaa
Login to View More

Abstract

The invention provides an ultra-wideband target electromagnetic scattering characteristic test system and method. The method includes: firstly, measuring a calibration object on a rotary table by fixing a first group of feed sources working on a first frequency band on a support capable of automatically switching the feed sources so as to continuously switch 2-27GHz plane waves emitted by the feed sources, and receiving reflected echo data; secondly, still performing 2-27GHz measurement by replacing a target object at the position of the calibration object; thirdly, after test ends, keeping the target object stationary, measuring the target object on the rotary table by 27-40GHz plane waves emitted by a second group of feed sources working on a second frequency band and receiving reflected echo data; fourthly, placing the previous calibration object at the position of the target object, performing calibration testing through the second frequency band, and receiving calibrated reflected echo data. Through the test data and by combining the data integrating technology, ultra-wideband target electromagnetic scattering characteristics of the target object can be acquired.

Description

technical field [0001] The invention relates to the field of material technology, in particular to a system and method for testing the electromagnetic scattering characteristics of an ultra-broadband target. Background technique [0002] In the existing technology, it is possible to obtain rich information of the target from low frequency to high frequency through the electromagnetic scattering characteristics of the ultra-wideband target, and the effective use of the ultra-wideband electromagnetic scattering characteristics of the target has great significance for the research of high-resolution radar technology, imaging technology, and target recognition technology. important meaning. From the perspective of radar imaging, the larger the bandwidth of the acquired target characteristics, the higher the distance resolution can be obtained, so as to obtain the finer distribution characteristics of the scattering center, and the acquisition of target scattering data through me...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R29/08G01S7/41
Inventor 孙金海张少华黄璟蔡禾巢增明肖志河梁子长
Owner BEIJING INST OF ENVIRONMENTAL FEATURES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com